OpticsInfoBase

Design of a general point focusing crystal geometry for x-ray spectroscopy

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• JOSA A, Vol. 29, Issue 1, pp. 68-77 (January 2012)
• Pestehe Sayyed Jalal, Askari Germi Golamreza

High-efficiency x-ray gratings with asymmetric-cut multilayers

• Abstract

• JOSA A, Vol. 29, Issue 3, pp. 216-230 (March 2012)
• Saša Bajt, Henry N. Chapman, Andrew Aquila, Eric Gullikson

Iterative retrieval of one-dimensional x ray wave field using a single intensity measurement

• Abstract

• Optics Letters, Vol. 37, Issue 2, pp. 262-264 (January 2012)
• D. Pelliccia, D. M. Paganin, A. Sorrentino, I. Bukreeva, A. Cedola, S. Lagomarsino

Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser

• Abstract

• Optics Letters, Vol. 37, Issue 24, pp. 5046-5048 (December 2012)
• Daniel Nilsson, Fredrik Uhlén, Anders Holmberg, Hans M. Hertz, Andreas Schropp, Jens Patommel, Robert Hoppe, Frank Seiboth, Vivienne Meier, Christian G. Schroer, Eric Galtier, Bob Nagler, Hae Ja Lee, Ulrich Vogt

Single-shot analysis of hard x-ray laser radiation using a noninvasive grating spectrometer

• Abstract

• Optics Letters, Vol. 37, Issue 24, pp. 5073-5075 (December 2012)
• Petri Karvinen, Simon Rutishauser, Aldo Mozzanica, Dominic Greiffenberg, Pavle N. Juranić, Andreas Menzel, Alberto Lutman, Jacek Krzywinski, David M. Fritz, Henrik T. Lemke, Marco Cammarata, Christian David

Direct measurement of the x-ray refractive index by Fresnel diffraction at a transparent edge

• Abstract

• Optics Letters, Vol. 38, Issue 9, pp. 1563-1565 (May 2013)
• C. W. Gayer, D. Hemmers, C. Stelzmann, G. Pretzler

Framework for computing the spatial coherence effects of polycapillary x-ray optics

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• Optics Express, Vol. 20, Issue 4, pp. 3975-3982 (February 2012)
• Adam M. Zysk, Robert W. Schoonover, Qiaofeng Xu, Mark A. Anastasio

Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry

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• Optics Express, Vol. 20, Issue 4, pp. 4525-4536 (February 2012)
• Frank Siewert, Jana Buchheim, Sébastien Boutet, Garth J. Williams, Paul A. Montanez, Jacek Krzywinski, Riccardo Signorato

High wavevector temporal speckle correlations at the Linac Coherent Light Source

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• Optics Express, Vol. 20, Issue 9, pp. 9790-9800 (April 2012)
• Sooheyong Lee, Wojciech Roseker, Christian Gutt, Zhirong Huang, Yuantao Ding, Gerhard Grübel, Aymeric Robert

Non-null full field X-ray mirror metrology using SCOTS: a reflection deflectometry approach

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• Optics Express, Vol. 20, Issue 11, pp. 12393-12406 (May 2012)
• Peng Su, Yuhao Wang, James H. Burge, Konstantine Kaznatcheev, Mourad Idir

Polychromatic X-ray tomography: direct quantitative phase reconstruction

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• Optics Express, Vol. 20, Issue 21, pp. 23361-23366 (October 2012)
• Benedicta D. Arhatari, Grant van Riessen, Andrew Peele

Quantitative X-ray wavefront measurements of Fresnel zone plate and K-B mirrors using phase retrieval

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• Optics Express, Vol. 20, Issue 21, pp. 24038-24048 (October 2012)
• Xiaojing Huang, Michael Wojcik, Nicolas Burdet, Isaac Peterson, Graeme R. Morrison, David J. Vine, Daniel Legnini, Ross Harder, Yong S. Chu, Ian K. Robinson

A Bragg beam splitter for hard x-ray free-electron lasers

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• Optics Express, Vol. 21, Issue 3, pp. 2823-2831 (February 2013)
• Taito Osaka, Makina Yabashi, Yasuhisa Sano, Kensuke Tono, Yuichi Inubushi, Takahiro Sato, Satoshi Matsuyama, Tetsuya Ishikawa, Kazuto Yamauchi

X-ray imaging inside the focal spot of polycapillary optics using the coded aperture concept

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• Optics Express, Vol. 21, Issue 3, pp. 2920-2927 (February 2013)
• K. M. Dąbrowski, D. T. Dul, P. Korecki

Inner-focusing reconstruction method for grating-based phase-contrast CT

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• Optics Express, Vol. 21, Issue 5, pp. 6224-6232 (March 2013)
• Yan Xi, Jun Zhao

Damage investigation on tungsten and diamond diffractive optics at a hard x-ray free-electron laser

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• Optics Express, Vol. 21, Issue 7, pp. 8051-8061 (April 2013)
• Fredrik Uhlén, Daniel Nilsson, Anders Holmberg, Hans M. Hertz, Christian G. Schroer, Frank Seiboth, Jens Patommel, Vivienne Meier, Robert Hoppe, Andreas Schropp, Hae Ja Lee, Bob Nagler, Eric Galtier, Jacek Krzywinski, Harald Sinn, Ulrich Vogt

Ion beam lithography for Fresnel zone plates in X-ray microscopy

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• Optics Express, Vol. 21, Issue 10, pp. 11747-11756 (May 2013)
• Kahraman Keskinbora, Corinne Grévent, Michael Bechtel, Markus Weigand, Eberhard Goering, Achim Nadzeyka, Lloyd Peto, Stefan Rehbein, Gerd Schneider, Rolf Follath, Joan Vila-Comamala, Hanfei Yan, Gisela Schütz

Extended theory of soft x-ray reflection for realistic lamellar multilayer gratings

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• Optics Express, Vol. 21, Issue 11, pp. 13105-13117 (June 2013)
• R. van der Meer, I.V. Kozhevnikov, H.M.J. Bastiaens, K.-J. Boller, F. Bijkerk

Development and calibration of mirrors and gratings for the soft x-ray materials science beamline at the Linac Coherent Light Source free-electron laser

• Abstract

• Applied Optics, Vol. 51, Issue 12, pp. 2118-2128 (April 2012)
• Regina Soufli, Mónica Fernández-Perea, Sherry L. Baker, Jeff C. Robinson, Eric M. Gullikson, Philip Heimann, Valeriy V. Yashchuk, Wayne R. McKinney, William F. Schlotter, Michael Rowen

Quantitative determination of higher harmonic content in the soft x-ray spectra of toroidal grating monochromator using a reflection multilayer

• Abstract

• Applied Optics, Vol. 51, Issue 16, pp. 3552-3557 (June 2012)
• Mohammed H. Modi, R. K. Gupta, Amol Singh, G. S. Lodha