Compact Zernike phase contrast x-ray microscopy using a single-element optic

• Abstract

• Optics Letters, Vol. 33, Issue 9, pp. 932-934 (May 2008)
• O. von Hofsten, M. Bertilson, M. Lindblom, A. Holmberg, U. Vogt

Normal-incidence silicon–gadolinium multilayers for imaging at 63 nm wavelength

• Abstract

• Optics Letters, Vol. 33, Issue 9, pp. 965-967 (May 2008)
• Benjawan Kjornrattanawanich, David L. Windt, John F. Seely

Extreme-ultraviolet microexposure tool at 0.5 NA for sub-16 nm lithography

• Abstract

• Optics Letters, Vol. 33, Issue 24, pp. 2995-2997 (December 2008)
• Michael Goldstein, Russ Hudyma, Patrick Naulleau, Stefan Wurm

Performance of a picosecond x-ray delay line unit at 8.39 keV

• Abstract

• Optics Letters, Vol. 34, Issue 12, pp. 1768-1770 (June 2009)
• Wojciech Roseker, Hermann Franz, Horst Schulte-Schrepping, Anita Ehnes, Olaf Leupold, Federico Zontone, Aymeric Robert, Gerhard Grübel

A non-iterative reconstruction method for direct and unambiguous coherent diffractive imaging

• Abstract
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• Optics Express, Vol. 15, Issue 16, pp. 9954-9962 (August 2007)
• S. G. Podorov, K. M. Pavlov, D. M. Paganin

13.5 nm EUV generation from tin-doped droplets using a fiber laser

• Abstract
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• Optics Express, Vol. 15, Issue 25, pp. 16348-16356 (December 2007)
• Simi A. George, Kai-Chung Hou, Kazutoshi Takenoshita, Almantas Galvanauskas, Martin C. Richardson

Theoretical development of a high-resolution differential-interference-contrast optic for x-ray microscopy

• Abstract
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• Optics Express, Vol. 16, Issue 2, pp. 1132-1141 (January 2008)
• Olov von Hofsten, Michael Bertilson, Ulrich Vogt

Phase contrast soft x-ray microscopy using Zernike zone plates

• Abstract
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• Optics Express, Vol. 16, Issue 3, pp. 1559-1564 (February 2008)
• Anne Sakdinawat, Yanwei Liu

Nonlinear optics in the X-ray regime: nonlinear waves and self-action effects

• Abstract
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• Optics Express, Vol. 16, Issue 12, pp. 8324-8331 (June 2008)
• C. Conti, A. Fratalocchi, G. Ruocco, F. Sette

Long and compact x-ray pathway for experiments requiring high coherent x-ray beams

• Abstract
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• Optics Express, Vol. 16, Issue 13, pp. 9284-9289 (June 2008)
• Marcelo G. Hönnicke, Edson M. Kakuno, Guinther Kellerman, Irineu Mazzaro, Daniel Abler, Cesar Cusatis

Soft X-ray holographic grating beam splitter including a double frequency grating for interferometer pre-alignment

• Abstract
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• Optics Express, Vol. 16, Issue 19, pp. 14761-14770 (September 2008)
• Ying Liu, Xin Tan, Zhengkun Liu, Xiangdong Xu, Yilin Hong, Shaojun Fu

Si lattice parameter measurement by centimeter X-ray interferometry

• Abstract
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• Optics Express, Vol. 16, Issue 21, pp. 16877-16888 (October 2008)
• Luca Ferroglio, Giovanni Mana, Enrico Massa

Phase imaging using a polychromatic x-ray laboratory source

• Abstract
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• Optics Express, Vol. 16, Issue 24, pp. 19950-19956 (November 2008)
• B. D. Arhatari, K. Hannah, E. Balaur, A. G. Peele

Characterizing isolated attosecond pulses from hollow-core waveguides using multi-cycle driving pulses

• Abstract
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• Optics Express, Vol. 17, Issue 6, pp. 4611-4633 (March 2009)
• I. Thomann, A. Bahabad, X. Liu, R. Trebino, M. M. Murnane, H. C. Kapteyn

High-resolution computed tomography with a compact soft x-ray microscope

• Abstract
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• Optics Express, Vol. 17, Issue 13, pp. 11057-11065 (June 2009)
• Michael Bertilson, Olov von Hofsten, Ulrich Vogt, Anders Holmberg, Hans M. Hertz

Observation of a bent crystal-lattice by x-ray interferometry

• Abstract
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• Optics Express, Vol. 17, Issue 13, pp. 11172-11178 (June 2009)
• Giovanni Mana, Enrico Massa, Luca Ferroglio

A low-absorption x-ray energy filter for small-scale applications

• Abstract
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• Optics Express, Vol. 17, Issue 14, pp. 11388-11398 (July 2009)
• Erik Fredenberg, Björn Cederström, Peter Nillius, Carolina Ribbing, Staffan Karlsson, Mats Danielsson

Optimization of multilayer mirrors at 13.4 nm with more than two materials

• Abstract

• Applied Optics, Vol. 47, Issue 12, pp. 2155-2160 (April 2008)
• S. M. Al-Marzoug, R. J. Hodgson

Detection of the X-ray spectra of imploding neon Z-pinch with elliptically bent mica crystal spectrometer

• Abstract

• Chinese Optics Letters, Vol. 6, Issue 8, pp. 622-624 (August 2008)
• Jun Shi, Shali Xiao, Hongjian Wang, Xianbin Huang, Libing Yang, Shenye Liu

High resolution X-ray spherically bent crystal spectrometer for laser-produced plasma diagnostics

• Abstract

• Chinese Optics Letters, Vol. 7, Issue 1, pp. 92-94 (January 2009)
• Shali Xiao, Hongjian Wang, Jun Shi, Changhuan Tang, Shenye Liu