X-ray phase-contrast imaging: transmission functions separable in Cartesian coordinates

• Abstract

• JOSA A, Vol. 24, Issue 4, pp. 1201-1208 (April 2007)
• Guohua Cao, Theron J. Hamilton, Christoph Rose-Petruck, Gerald J. Diebold

Single-shot spatial-coherence measurement of 13 nm high-order harmonic beam by a Young's double-slit measurement

• Abstract

• Optics Letters, Vol. 32, Issue 6, pp. 722-724 (March 2007)
• Yutaka Nagata, Kentaro Furusawa, Yasuo Nabekawa, Katsumi Midorikawa

Compact Zernike phase contrast x-ray microscopy using a single-element optic

• Abstract

• Optics Letters, Vol. 33, Issue 9, pp. 932-934 (May 2008)
• O. von Hofsten, M. Bertilson, M. Lindblom, A. Holmberg, U. Vogt

Normal-incidence silicon–gadolinium multilayers for imaging at 63 nm wavelength

• Abstract

• Optics Letters, Vol. 33, Issue 9, pp. 965-967 (May 2008)
• Benjawan Kjornrattanawanich, David L. Windt, John F. Seely

Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids

• Abstract
•  

• Optics Express, Vol. 15, Issue 10, pp. 6036-6043 (May 2007)
• J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, U. Zastrau

A non-iterative reconstruction method for direct and unambiguous coherent diffractive imaging

• Abstract
•  

• Optics Express, Vol. 15, Issue 16, pp. 9954-9962 (August 2007)
• S. G. Podorov, K. M. Pavlov, D. M. Paganin

13.5 nm EUV generation from tin-doped droplets using a fiber laser

• Abstract
•  

• Optics Express, Vol. 15, Issue 25, pp. 16348-16356 (December 2007)
• Simi A. George, Kai-Chung Hou, Kazutoshi Takenoshita, Almantas Galvanauskas, Martin C. Richardson

Theoretical development of a high-resolution differential-interference-contrast optic for x-ray microscopy

• Abstract
•  

• Optics Express, Vol. 16, Issue 2, pp. 1132-1141 (January 2008)
• Olov von Hofsten, Michael Bertilson, Ulrich Vogt

Phase contrast soft x-ray microscopy using Zernike zone plates

• Abstract
•  

• Optics Express, Vol. 16, Issue 3, pp. 1559-1564 (February 2008)
• Anne Sakdinawat, Yanwei Liu

Nonlinear optics in the X-ray regime: nonlinear waves and self-action effects

• Abstract
•  

• Optics Express, Vol. 16, Issue 12, pp. 8324-8331 (June 2008)
• C. Conti, A. Fratalocchi, G. Ruocco, F. Sette

Long and compact x-ray pathway for experiments requiring high coherent x-ray beams

• Abstract
•  

• Optics Express, Vol. 16, Issue 13, pp. 9284-9289 (June 2008)
• Marcelo G. Hönnicke, Edson M. Kakuno, Guinther Kellerman, Irineu Mazzaro, Daniel Abler, Cesar Cusatis

Soft X-ray holographic grating beam splitter including a double frequency grating for interferometer pre-alignment

• Abstract
•  

• Optics Express, Vol. 16, Issue 19, pp. 14761-14770 (September 2008)
• Ying Liu, Xin Tan, Zhengkun Liu, Xiangdong Xu, Yilin Hong, Shaojun Fu

Si lattice parameter measurement by centimeter X-ray interferometry

• Abstract
•  

• Optics Express, Vol. 16, Issue 21, pp. 16877-16888 (October 2008)
• Luca Ferroglio, Giovanni Mana, Enrico Massa

Phase imaging using a polychromatic x-ray laboratory source

• Abstract
•  

• Optics Express, Vol. 16, Issue 24, pp. 19950-19956 (November 2008)
• B. D. Arhatari, K. Hannah, E. Balaur, A. G. Peele

Measurements of the hard-x-ray reflectivity of iridium

• Abstract

• Applied Optics, Vol. 46, Issue 2, pp. 185-189 (January 2007)
• S. Romaine, R. Bruni, P. Gorenstein, Z. Zhong

Optimization of multilayer mirrors at 13.4 nm with more than two materials

• Abstract

• Applied Optics, Vol. 47, Issue 12, pp. 2155-2160 (April 2008)
• S. M. Al-Marzoug, R. J. Hodgson

Determination of the deposition rate of DC magnetron sputtering in fabrication of X-ray supermirrors

• Abstract

• Chinese Optics Letters, Vol. 4, Issue 9, pp. 550-552 (September 2006)
• Fengli Wang, Zhanshan Wang, Jingtao Zhu, Zhong Zhang, Wenjuan Wu, Shumin Zhang, Lingyan Chen

Design and fabrication of one-dimensional focusing X-ray compound lens with Al material

• Abstract

• Chinese Optics Letters, Vol. 4, Issue 9, pp. 556-558 (September 2006)
• Zichun Le, Ming Zhang, Jingqiu Liang, Wen Dong, Kai Liu, Bisheng Quan

Interface roughness, surface roughness and soft X-ray reflectivity of Mo/Si multilayers with different layer number

• Abstract

• Chinese Optics Letters, Vol. 5, Issue 5, pp. 301-303 (May 2007)
• Junling Qin, Jianda Shao, Kui Yi, Zhengxiu Fan

Detection of the X-ray spectra of imploding neon Z-pinch with elliptically bent mica crystal spectrometer

• Abstract

• Chinese Optics Letters, Vol. 6, Issue 8, pp. 622-624 (August 2008)
• Jun Shi, Shali Xiao, Hongjian Wang, Xianbin Huang, Libing Yang, Shenye Liu