Compact Zernike phase contrast x-ray microscopy using a single-element optic

• Abstract

• Optics Letters, Vol. 33, Issue 9, pp. 932-934 (May 2008)
• O. von Hofsten, M. Bertilson, M. Lindblom, A. Holmberg, U. Vogt

Extreme-ultraviolet microexposure tool at 0.5 NA for sub-16 nm lithography

• Abstract

• Optics Letters, Vol. 33, Issue 24, pp. 2995-2997 (December 2008)
• Michael Goldstein, Russ Hudyma, Patrick Naulleau, Stefan Wurm

Performance of a picosecond x-ray delay line unit at 8.39 keV

• Abstract

• Optics Letters, Vol. 34, Issue 12, pp. 1768-1770 (June 2009)
• Wojciech Roseker, Hermann Franz, Horst Schulte-Schrepping, Anita Ehnes, Olaf Leupold, Federico Zontone, Aymeric Robert, Gerhard Grübel

Sub-25-nm laboratory x-ray microscopy using a compound Fresnel zone plate

• Abstract

• Optics Letters, Vol. 34, Issue 17, pp. 2631-2633 (September 2009)
• Olov von Hofsten, Michael Bertilson, Julia Reinspach, Anders Holmberg, Hans M. Hertz, Ulrich Vogt

Nonlinear optics in the X-ray regime: nonlinear waves and self-action effects

• Abstract
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• Optics Express, Vol. 16, Issue 12, pp. 8324-8331 (June 2008)
• C. Conti, A. Fratalocchi, G. Ruocco, F. Sette

Long and compact x-ray pathway for experiments requiring high coherent x-ray beams

• Abstract
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• Optics Express, Vol. 16, Issue 13, pp. 9284-9289 (June 2008)
• Marcelo G. Hönnicke, Edson M. Kakuno, Guinther Kellerman, Irineu Mazzaro, Daniel Abler, Cesar Cusatis

Soft X-ray holographic grating beam splitter including a double frequency grating for interferometer pre-alignment

• Abstract
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• Optics Express, Vol. 16, Issue 19, pp. 14761-14770 (September 2008)
• Ying Liu, Xin Tan, Zhengkun Liu, Xiangdong Xu, Yilin Hong, Shaojun Fu

Si lattice parameter measurement by centimeter X-ray interferometry

• Abstract
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• Optics Express, Vol. 16, Issue 21, pp. 16877-16888 (October 2008)
• Luca Ferroglio, Giovanni Mana, Enrico Massa

Phase imaging using a polychromatic x-ray laboratory source

• Abstract
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• Optics Express, Vol. 16, Issue 24, pp. 19950-19956 (November 2008)
• B. D. Arhatari, K. Hannah, E. Balaur, A. G. Peele

Characterizing isolated attosecond pulses from hollow-core waveguides using multi-cycle driving pulses

• Abstract
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• Optics Express, Vol. 17, Issue 6, pp. 4611-4633 (March 2009)
• I. Thomann, A. Bahabad, X. Liu, R. Trebino, M. M. Murnane, H. C. Kapteyn

High-resolution computed tomography with a compact soft x-ray microscope

• Abstract
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• Optics Express, Vol. 17, Issue 13, pp. 11057-11065 (June 2009)
• Michael Bertilson, Olov von Hofsten, Ulrich Vogt, Anders Holmberg, Hans M. Hertz

Observation of a bent crystal-lattice by x-ray interferometry

• Abstract
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• Optics Express, Vol. 17, Issue 13, pp. 11172-11178 (June 2009)
• Giovanni Mana, Enrico Massa, Luca Ferroglio

A low-absorption x-ray energy filter for small-scale applications

• Abstract
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• Optics Express, Vol. 17, Issue 14, pp. 11388-11398 (July 2009)
• Erik Fredenberg, Björn Cederström, Peter Nillius, Carolina Ribbing, Staffan Karlsson, Mats Danielsson

Detailed simulation of a Lobster-eye telescope

• Abstract
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• Optics Express, Vol. 17, Issue 16, pp. 14156-14165 (August 2009)
• Corey T. Putkunz, Andrew G. Peele

Predicting the coherent X-ray wavefront focal properties at the Linac Coherent Light Source (LCLS) X-ray free electron laser

• Abstract
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• Optics Express, Vol. 17, Issue 18, pp. 15508-15519 (August 2009)
• Anton Barty, Regina Soufli, Tom McCarville, Sherry L. Baker, Michael J. Pivovaroff, Peter Stefan, Richard Bionta

Performance, structure, and stability of SiC/Al multilayer films for extreme ultraviolet applications

• Abstract

• Applied Optics, Vol. 48, Issue 26, pp. 4932-4941 (September 2009)
• David L. Windt, Jeffrey A. Bellotti

Performance optimization of Si/Gd extreme ultraviolet multilayers

• Abstract

• Applied Optics, Vol. 48, Issue 29, pp. 5502-5508 (October 2009)
• David L. Windt, Jeffrey A. Bellotti, Benjawan Kjornrattanawanich, John F. Seely

Detection of the X-ray spectra of imploding neon Z-pinch with elliptically bent mica crystal spectrometer

• Abstract

• Chinese Optics Letters, Vol. 6, Issue 8, pp. 622-624 (August 2008)
• Jun Shi, Shali Xiao, Hongjian Wang, Xianbin Huang, Libing Yang, Shenye Liu

High resolution X-ray spherically bent crystal spectrometer for laser-produced plasma diagnostics

• Abstract

• Chinese Optics Letters, Vol. 7, Issue 1, pp. 92-94 (January 2009)
• Shali Xiao, Hongjian Wang, Jun Shi, Changhuan Tang, Shenye Liu

Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering

• Abstract

• Chinese Optics Letters, Vol. 7, Issue 8, pp. 738-740 (August 2009)
• Min Dai, Zhong Zhang, Jingtao Zhu, Xiaoqiang Wang, Jing Xu, Xiuhua Fu, Liang Bai, Qiushi Huang, Zhanshan Wang, Lingyan Chen