Exact transparent boundary condition for the parabolic equation in a rectangular computational domain

• Abstract

• JOSA A, Vol. 28, Issue 3, pp. 373-380 (March 2011)
• R. M. Feshchenko, A. V. Popov

Design of a general point focusing crystal geometry for x-ray spectroscopy

• Abstract

• JOSA A, Vol. 29, Issue 1, pp. 68-77 (January 2012)
• Sayyed Jalal Pestehe, Golamreza Askari Germi

Large-aperture focusing of high-energy x rays with a rolled polyimide film

• Abstract

• Optics Letters, Vol. 36, Issue 4, pp. 555-557 (February 2011)
• Peter Nillius, Staffan Karlsson, Björn Cederström, Erik Fredenberg, Mats Danielsson

Hard x-ray Zernike microscopy reaches 30 nm resolution

• Abstract
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• Optics Letters, Vol. 36, Issue 7, pp. 1269-1271 (April 2011)
• Yu-Tung Chen, Tsung-Yu Chen, Jaemock Yi, Yong S. Chu, Wah-Keat Lee, Cheng-Liang Wang, Ivan M. Kempson, Y. Hwu, Vincent Gajdosik, G. Margaritondo

Resonance modes filtering in structured x-ray waveguides

• Abstract

• Optics Letters, Vol. 36, Issue 14, pp. 2602-2604 (July 2011)
• Inna Bukreeva, Alessia Cedola, Andrea Sorrentino, Daniele Pelliccia, Viktor Asadchikov, Stefano Lagomarsino

Laboratory soft-x-ray microscope for cryotomography of biological specimens

• Abstract
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• Optics Letters, Vol. 36, Issue 14, pp. 2728-2730 (July 2011)
• Michael Bertilson, Olov von Hofsten, Ulrich Vogt, Anders Holmberg, Athanasia E. Christakou, Hans M. Hertz

Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements

• Abstract

• Optics Letters, Vol. 36, Issue 17, pp. 3386-3388 (September 2011)
• R. A. Loch, A. Dubrouil, R. Sobierajski, D. Descamps, B. Fabre, P. Lidon, R. W. E. van de Kruijs, F. Boekhout, E. Gullikson, J. Gaudin, E. Louis, F. Bijkerk, E. Mével, S. Petit, E. Constant, Y. Mairesse

Iterative retrieval of one-dimensional x ray wave field using a single intensity measurement

• Abstract

• Optics Letters, Vol. 37, Issue 2, pp. 262-264 (January 2012)
• D. Pelliccia, D. M. Paganin, A. Sorrentino, I. Bukreeva, A. Cedola, S. Lagomarsino

Quantitative phase imaging with polychromatic x-ray sources

• Abstract
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• Optics Express, Vol. 19, Issue 9, pp. 8127-8134 (April 2011)
• Mac B. Luu, Benedicta D. Arhatari, Chanh Q. Tran, Eugeniu Balaur, Bao T. Pham, Nghia T. Vo, Bo Chen, Corey T. Putkunz, Nigel Kirby, Stephen Mudie, Andrew G. Peele

Analytic theory of soft x-ray diffraction by lamellar multilayer gratings

• Abstract
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• Optics Express, Vol. 19, Issue 10, pp. 9172-9184 (May 2011)
• I. V. Kozhevnikov, R. van der Meer, H. M. J. Bastiaens, K.-J. Boller, F. Bijkerk

High efficiency nano-focusing kinoform optics for synchrotron radiation

• Abstract
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• Optics Express, Vol. 19, Issue 12, pp. 11120-11127 (June 2011)
• L. Alianelli, K. J. S. Sawhney, R. Barrett, I. Pape, A. Malik, M. C. Wilson

Numerical model for tomographic image formation in transmission x-ray microscopy

• Abstract
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• Optics Express, Vol. 19, Issue 12, pp. 11578-11583 (June 2011)
• Michael Bertilson, Olov von Hofsten, Hans M. Hertz, Ulrich Vogt

Determination of the evolution of layer thickness errors and interfacial imperfections in ultrathin sputtered Cr/C multilayers using high-resolution transmission electron microscopy

• Abstract
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• Optics Express, Vol. 19, Issue 12, pp. 11815-11824 (June 2011)
• Hui Jiang, Alan Michette, Slawka Pfauntsch, Zhanshan Wang, Jingtao Zhu, Dehui Li

Time-resolved investigation of nanometer scale deformations induced by a high flux x-ray beam

• Abstract
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• Optics Express, Vol. 19, Issue 16, pp. 15516-15524 (August 2011)
• J. Gaudin, B. Keitel, A. Jurgilaitis, R. Nüske, L. Guérin, J. Larsson, K. Mann, B. Schäfer, K. Tiedtke, A. Trapp, Th. Tschentscher, F. Yang, M. Wulff, H. Sinn, B. Flöter

X-ray optics simulation using Gaussian superposition technique

• Abstract
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• Optics Express, Vol. 19, Issue 20, pp. 19050-19060 (September 2011)
• Mourad Idir, Moisés Cywiak, Arquímedes Morales, Mohammed H. Modi

Coherent x-ray wavefront reconstruction of a partially illuminated Fresnel zone plate

• Abstract
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• Optics Express, Vol. 19, Issue 20, pp. 19223-19232 (September 2011)
• F. Mastropietro, D. Carbone, A. Diaz, J. Eymery, A. Sentenac, T. H. Metzger, V. Chamard, V. Favre-Nicolin

Quantitative single-exposure x-ray phase contrast imaging using a single attenuation grid

• Abstract
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• Optics Express, Vol. 19, Issue 20, pp. 19781-19789 (September 2011)
• Kaye S. Morgan, David M. Paganin, Karen K. W. Siu

Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging

• Abstract
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• Optics Express, Vol. 19, Issue 22, pp. 21333-21344 (October 2011)
• Joan Vila-Comamala, Ana Diaz, Manuel Guizar-Sicairos, Alexandre Mantion, Cameron M. Kewish, Andreas Menzel, Oliver Bunk, Christian David

Multi-wavelength elemental contrast absorption imaging

• Abstract
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• Optics Express, Vol. 19, Issue 27, pp. 25969-25980 (December 2011)
• Mac B. Luu, Chanh Q. Tran, Benedicta Arhatari, Eugeniu Balaur, Nirgel Kirby, Stephen Mudie, Bao T. Pham, Nghia T. Vo, Corey T. Putkunz, Francesco De Carlo, Andrew G. Peele

Framework for computing the spatial coherence effects of polycapillary x-ray optics

• Abstract
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• Optics Express, Vol. 20, Issue 4, pp. 3975-3982 (February 2012)
• Adam M. Zysk, Robert W. Schoonover, Qiaofeng Xu, Mark A. Anastasio