Phase-space reconstruction of focused x-ray fields

• Abstract

• JOSA A, Vol. 23, Issue 7, pp. 1779-1786 (July 2006)
• Chanh Q. Tran, Adrian P. Mancuso, Bipin B. Dhal, Keith A. Nugent, Andrew G. Peele, Zhonghou Cai, David Paterson

X-ray noninterferometric phase imaging: a unified picture

• Abstract

• JOSA A, Vol. 24, Issue 2, pp. 536-547 (February 2007)
• Keith A. Nugent

Performance of SISSI, the infrared beamline of the ELETTRA storage ring

• Abstract

• JOSA B, Vol. 24, Issue 4, pp. 959-964 (April 2007)
• Stefano Lupi, Alessandro Nucara, Andrea Perucchi, Paolo Calvani, Michele Ortolani, Luca Quaroni, Maya Kiskinova

Crystal optics as guard apertures for coherent x-ray diffraction imaging

• Abstract

• Optics Letters, Vol. 31, Issue 21, pp. 3194-3196 (November 2006)
• Xianghui Xiao, Martin D. de Jonge, Yuncheng Zhong, Yong S. Chu, Qun Shen

Recovering the complete coherence function of a generalized Schell model field

• Abstract

• Optics Letters, Vol. 31, Issue 22, pp. 3226-3227 (November 2006)
• C. Q. Tran, K. A. Nugent

Fresnel-propagated submicrometer x-ray imaging of water-immersed tooth dentin

• Abstract
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• Optics Letters, Vol. 32, Issue 20, pp. 2987-2989 (October 2007)
• Simon Zabler, Peter Cloetens, Paul Zaslansky

Performance of a picosecond x-ray delay line unit at 8.39 keV

• Abstract

• Optics Letters, Vol. 34, Issue 12, pp. 1768-1770 (June 2009)
• Wojciech Roseker, Hermann Franz, Horst Schulte-Schrepping, Anita Ehnes, Olaf Leupold, Federico Zontone, Aymeric Robert, Gerhard Grübel

Broad angular multilayer analyzer for soft X-rays

• Abstract
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• Optics Express, Vol. 14, Issue 6, pp. 2533-2538 (March 2006)
• Z. S. Wang, H. C. Wang, J. T. Zhu, F. L. Wang, Z. X. Gu, L. Y. Chen, A. G. Michette, A. K. Powell, S. J. Pfauntsch, F. Schäfers

A numerical wave-optical approach for the simulation of analyzer-based x-ray imaging

• Abstract
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• Optics Express, Vol. 15, Issue 9, pp. 5641-5648 (April 2007)
• A. Bravin, V. Mocella, P. Coan, A. Astolfo, C. Ferrero

An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 1. Derivation of caustic shapes

• Abstract
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• Optics Express, Vol. 16, Issue 16, pp. 12050-12059 (August 2008)
• J.-P. Guigay, Ch. Morawe, V. Mocella, C. Ferrero

Free-standing THz electromagnetic metamaterials

• Abstract
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• Optics Express, Vol. 16, Issue 18, pp. 13773-13780 (September 2008)
• H. O. Moser, J. A. Kong, L. K. Jian, H. S. Chen, G. Liu, M. Bahou, S. M. P. Kalaiselvi, S. M. Maniam, X. X. Cheng, B. I. Wu, P. D. Gu, A. Chen, S. P. Heussler, Shahrain bin Mahmood, L. Wen

An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 2. Interpretation and application to focusing experiments

• Abstract
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• Optics Express, Vol. 16, Issue 20, pp. 16138-16150 (September 2008)
• Ch. Morawe, J.-P. Guigay, V. Mocella, C. Ferrero

Comparison of refraction information extraction methods in diffraction enhanced imaging

• Abstract
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• Optics Express, Vol. 16, Issue 21, pp. 16704-16710 (October 2008)
• Chunhong Hu, Lu Zhang, Hui Li, Shuqian Lo

Digital In-line Holography with femtosecond VUV radiation provided by the free-electron laser FLASH

• Abstract
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• Optics Express, Vol. 17, Issue 10, pp. 8220-8228 (May 2009)
• Axel Rosenhahn, Florian Staier, Thomas Nisius, David Schäfer, Ruth Barth, Christof Christophis, Lorenz-M. Stadler, Simone Streit-Nierobisch, Christian Gutt, Adrian Mancuso, Andreas Schropp, Johannes Gulden, Bernd Reime, Josef Feldhaus, Edgar Weckert, Bastian Pfau, Christian M. Günther, René Könnecke, Stefan Eisebitt, Michael Martins, Bart Faatz, Natalia Guerassimova, Katja Honkavaara, Rolf Treusch, Evgueni Saldin, Siegfried Schreiber, Evgeny A. Schneidmiller, Mikhail V. Yurkov, Ivan Vartanyants, Gerhard Grübel, Michael Grunze, Thomas Wilhein

Lithographic characterization of the spherical error in an extreme-ultraviolet optic by use of a programmable pupil-fill illuminator

• Abstract

• Applied Optics, Vol. 45, Issue 9, pp. 1957-1963 (March 2006)
• Patrick P. Naulleau, Jason P. Cain, Kenneth A. Goldberg

Finite-difference field calculations for two-dimensionally confined x-ray waveguides

• Abstract

• Applied Optics, Vol. 45, Issue 19, pp. 4603-4608 (July 2006)
• Christian Fuhse, Tim Salditt

Polarization-dependent vacuum-ultraviolet reflectometry using elliptically polarized synchrotron radiation

• Abstract

• Applied Optics, Vol. 46, Issue 32, pp. 7797-7804 (November 2007)
• Alexander Gottwald, Françoise Bridou, Mireille Cuniot-Ponsard, Jean-Michel Desvignes, Simone Kroth, Udo Kroth, Wolfgang Paustian, Mathias Richter, Hendrik Schöppe, Reiner Thornagel

High reflectivity multilayer for He-II radiation at 30.4 nm

• Abstract

• Applied Optics, Vol. 47, Issue 13, pp. C310-C314 (May 2008)
• Jingtao Zhu, Zhanshan Wang, Zhong Zhang, Fengli Wang, Hongchang Wang, Wenjuan Wu, Shumin Zhang, Da Xu, Lingyan Chen, Hongjun Zhou, Tonglin Huo, Mingqi Cui, Yidong Zhao

Compact matrix formalism for phase space analysis of complex optical systems

• Abstract

• Applied Optics, Vol. 47, Issue 22, pp. E106-E115 (August 2008)
• Detlef-Matthias Smilgies

B4C/Mo/Si high reflectivity multilayer mirror at 30.4 nm

• Abstract

• Chinese Optics Letters, Vol. 4, Issue 10, pp. 611-613 (October 2006)
• Zhanshan Wang, Shumin Zhang, Wenjuan Wu, Jingtao Zhu, Hongchang Wang, Cunxia Li, Yao Xu, Fengli Wang, Zhong Zhang, Lingyan Chen, Hongjun Zhou, Tonglin Huo