Performance of a picosecond x-ray delay line unit at 8.39 keV

• Abstract

• Optics Letters, Vol. 34, Issue 12, pp. 1768-1770 (June 2009)
• Wojciech Roseker, Hermann Franz, Horst Schulte-Schrepping, Anita Ehnes, Olaf Leupold, Federico Zontone, Aymeric Robert, Gerhard Grübel

Photoacoustic spectroscopy using coherent synchrotron radiation: application to α-lactose monohydrate

• Abstract

• Optics Letters, Vol. 35, Issue 18, pp. 3090-3092 (September 2010)
• Brant Billinghurst, Tim May, Les Dallin, Ward Wurtz, Mark de Jong, Kirk H. Michaelian

Subpicosecond hard x-ray streak camera using single-photon counting

• Abstract

• Optics Letters, Vol. 35, Issue 19, pp. 3219-3221 (October 2010)
• Henrik Enquist, Hengameh Navirian, Ralf Nüske, Clemens von Korff Schmising, Andrius Jurgilaitis, Marc Herzog, Matias Bargheer, Peter Sondhauss, Jörgen Larsson

Quantitative x-ray phase-contrast imaging using a single grating of comparable pitch to sample feature size

• Abstract

• Optics Letters, Vol. 36, Issue 1, pp. 55-57 (January 2011)
• Kaye S. Morgan, David M. Paganin, Karen K. W. Siu

Quadriwave lateral shearing interferometry in an achromatic and continuously self-imaging regime for future x-ray phase imaging

• Abstract

• Optics Letters, Vol. 36, Issue 8, pp. 1398-1400 (April 2011)
• Julien Rizzi, Timm Weitkamp, Nicolas Guérineau, Mourad Idir, Pascal Mercère, Guillaume Druart, Grégory Vincent, Paulo da Silva, Jérôme Primot

Digital In-line Holography with femtosecond VUV radiation provided by the free-electron laser FLASH

• Abstract
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• Optics Express, Vol. 17, Issue 10, pp. 8220-8228 (May 2009)
• Axel Rosenhahn, Florian Staier, Thomas Nisius, David Schäfer, Ruth Barth, Christof Christophis, Lorenz-M. Stadler, Simone Streit-Nierobisch, Christian Gutt, Adrian Mancuso, Andreas Schropp, Johannes Gulden, Bernd Reime, Josef Feldhaus, Edgar Weckert, Bastian Pfau, Christian M. Günther, René Könnecke, Stefan Eisebitt, Michael Martins, Bart Faatz, Natalia Guerassimova, Katja Honkavaara, Rolf Treusch, Evgueni Saldin, Siegfried Schreiber, Evgeny A. Schneidmiller, Mikhail V. Yurkov, Ivan Vartanyants, Gerhard Grübel, Michael Grunze, Thomas Wilhein

High-speed X-ray phase imaging and X-ray phase tomography with Talbot interferometer and white synchrotron radiation

• Abstract
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• Optics Express, Vol. 17, Issue 15, pp. 12540-12545 (July 2009)
• Atsushi Momose, Wataru Yashiro, Hirohide Maikusa, Yoshihiro Takeda

The PDMS-based microfluidic channel fabricated by synchrotron radiation stimulated etching

• Abstract
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• Optics Express, Vol. 18, Issue 9, pp. 9733-9738 (April 2010)
• Tingchao He, Changshun Wang, Tsuneo Urisu, Takeshi Nagahiro, Ryugo Tero, Rong Xia

Ultra-high resolution zone-doubled diffractive X-ray optics for the multi-keV regime

• Abstract
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• Optics Express, Vol. 19, Issue 1, pp. 175-184 (January 2011)
• Joan Vila-Comamala, Sergey Gorelick, Elina Färm, Cameron M. Kewish, Ana Diaz, Ray Barrett, Vitaliy A. Guzenko, Mikko Ritala, Christian David

Experimental characterization of the coherence properties of hard x-ray sources

• Abstract
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• Optics Express, Vol. 19, Issue 9, pp. 8073-8078 (April 2011)
• Daniele Pelliccia, Andrei Y. Nikulin, Herbert O. Moser, Keith A. Nugent

Four-dimensional X-ray phase tomography with Talbot interferometry and white synchrotron radiation: dynamic observation of a living worm

• Abstract
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• Optics Express, Vol. 19, Issue 9, pp. 8423-8432 (April 2011)
• Atsushi Momose, Wataru Yashiro, Sébastien Harasse, Hiroaki Kuwabara

X-ray optics simulation using Gaussian superposition technique

• Abstract
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• Optics Express, Vol. 19, Issue 20, pp. 19050-19060 (September 2011)
• Mourad Idir, Moisés Cywiak, Arquímedes Morales, Mohammed H. Modi

Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging

• Abstract
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• Optics Express, Vol. 19, Issue 22, pp. 21333-21344 (October 2011)
• Joan Vila-Comamala, Ana Diaz, Manuel Guizar-Sicairos, Alexandre Mantion, Cameron M. Kewish, Andreas Menzel, Oliver Bunk, Christian David

Thermal stability of Mg/Co multilayer with B₄C, Mo or Zr diffusion barrier layers

• Abstract
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• Optics Express, Vol. 19, Issue 22, pp. 21849-21854 (October 2011)
• Jingtao Zhu, Sika Zhou, Haochuan Li, Zhanshan Wang, Philippe Jonnard, Karine Le Guen, Min-Hui Hu, Jean-Michel André, Hongjun Zhou, Tonglin Huo

Multi-wavelength elemental contrast absorption imaging

• Abstract
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• Optics Express, Vol. 19, Issue 27, pp. 25969-25980 (December 2011)
• Mac B. Luu, Chanh Q. Tran, Benedicta Arhatari, Eugeniu Balaur, Nirgel Kirby, Stephen Mudie, Bao T. Pham, Nghia T. Vo, Corey T. Putkunz, Francesco De Carlo, Andrew G. Peele

Comparison of Mg-based multilayers for solar He II radiation at 30.4 nm wavelength

• Abstract

• Applied Optics, Vol. 49, Issue 20, pp. 3922-3925 (July 2010)
• Jingtao Zhu, Sika Zhou, Haochuan Li, Qiushi Huang, Zhanshan Wang, Karine Le Guen, Min-Hui Hu, Jean-Michel André, Philippe Jonnard

Exact revision of the elliptically bent mirror theory

• Abstract

• Applied Optics, Vol. 50, Issue 16, pp. 2413-2417 (June 2011)
• Chengwen Mao, Xiaohan Yu, Tiqiao Xiao, Aiguo Li, Ke Yang, Hua Wang, Fen Yan, Biao Deng

Raman spectroscopic study on Hela cells irradiated by X rays of different doses

• Abstract

• Chinese Optics Letters, Vol. 7, Issue 8, pp. 734-737 (August 2009)
• Jian Qi, Baoliang Liu, Yuntao Li, Dianyong Wu, Weiyue Tang

Mo/Si aperiodic multilayer broadband reflective mirror for 12.5-28.5-nm wavelength range

• Abstract

• Chinese Optics Letters, Vol. 9, Issue 2, pp. 023102- (February 2011)
• Moyan Tan, Haochuan Li, Qiushi Huang, Hongjun Zhou, Tonglin Huo, Xiaoqiang Wang, Jingtao Zhu

Accuracy and analysis of long-radius measurement with long trace profiler

• Abstract

• Chinese Optics Letters, Vol. 9, Issue 10, pp. 102301- (October 2011)
• Haixian Ye, Liming Yang