Trapping force and optical lifting under focused evanescent wave illumination
Optics Express, Vol. 12, Issue 22, pp. 5533-5538 doi:10.1364/OPEX.12.005533
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- OCIS Codes:
- (110.0180) Imaging systems : Microscopy
- (140.7010) Lasers and laser optics : Laser trapping
- (260.1960) Physical optics : Diffraction theory
Citation
Djenan Ganic, Xiaosong Gan, and Min Gu, "Trapping force and optical lifting under focused evanescent wave illumination," Opt. Express 12, 5533-5538 (2004)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-12-22-5533
Abstract
A physical model is presented to understand and calculate trapping force exerted on a dielectric micro-particle under focused evanescent wave illumination. This model is based on our recent vectorial diffraction model by a high numerical aperture objective operating under the total internal condition. As a result, trapping force in a focused evanescent spot generated by both plane wave (TEM00) and doughnut beam (TEM*01) illumination is calculated, showing an agreement with the measured results. It is also revealed by this model that unlike optical trapping in the far-field region, optical axial trapping force in an evanescent focal spot increases linearly with the size of a trapped particle. This prediction shows that it is possible to overcome the force of gravity to lift a polystyrene particle of up to 800 nm in radius with a laser beam of power 10 µW.
© 2004 Optical Society of America
» View Full Text: Acrobat PDF (407 KB)
History
Original Manuscript: September 16, 2004
Revised Manuscript: October 26, 2004
Published: November 1, 2004
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