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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 7 — Apr. 5, 2004
  • pp: 1377–1382

Nanosecond Z-scan measurements of the nonlinear refractive index of fused silica

Thomas Olivier, Franck Billard, and Hassan Akhouayri  »View Author Affiliations

Optics Express, Vol. 12, Issue 7, pp. 1377-1382 (2004)

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We present the results of Z-scan studies carried out on fused silica at 1064nm and 532nm with two different nanosecond pulse durations. Such measurements in silica and in the nanosecond regime are possible thanks to a high sensitivity setting up of the Z-scan method and in-situ characterizations of the spatio-temporal parameters of the beam. Besides, with the use of a newly adapted numerical simulation only the calibration errors of the measurement devices are significant. In these conditions, we found a higher value of the nonlinear refractive index than in the femtosecond regime and we show that these values depend on pulse duration, which indicates the contribution of nanosecond mechanisms like electrostriction.

© 2004 Optical Society of America

OCIS Codes
(120.3940) Instrumentation, measurement, and metrology : Metrology
(160.6030) Materials : Silica
(190.0190) Nonlinear optics : Nonlinear optics
(190.5940) Nonlinear optics : Self-action effects
(260.5950) Physical optics : Self-focusing
(320.4240) Ultrafast optics : Nanosecond phenomena

ToC Category:
Research Papers

Original Manuscript: February 11, 2004
Revised Manuscript: March 26, 2004
Published: April 5, 2004

Thomas Olivier, Franck Billard, and Hassan Akhouayri, "Nanosecond Z-scan measurements of the nonlinear refractive index of fused silica," Opt. Express 12, 1377-1382 (2004)

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