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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 1 — Jan. 10, 2005
  • pp: 106–114

Projection pattern intensity control technique for 3-D optical measurement

Cunwei Lu and Genki Cho  »View Author Affiliations

Optics Express, Vol. 13, Issue 1, pp. 106-114 (2005)

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A new projection pattern control technique is presented in an attempt to solve the problem whereby an image having an ideal intensity distribution cannot be photographed when measurement conditions, such as object color or object surface reflection, change. The proposed technique can adjust the intensity distribution of a projection pattern automatically, according to changes in the measurement conditions. An image with an ideal intensity distribution can then be obtained in a short time, approximately three projections on average. Thus, the speed, robustness, and practicality of 3-D image measurement can be improved.

© 2005 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(150.6910) Machine vision : Three-dimensional sensing

ToC Category:
Research Papers

Original Manuscript: October 27, 2004
Revised Manuscript: December 15, 2004
Manuscript Accepted: December 22, 2004
Published: January 10, 2005

Cunwei Lu and Genki Cho, "Projection pattern intensity control technique for 3-D optical measurement," Opt. Express 13, 106-114 (2005)

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