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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 17 — Aug. 22, 2005
  • pp: 6519–6526

Signal reconstruction from a scanning near-field optical microscopy approach curve

Dominique Barchiesi and Thomas Grosges  »View Author Affiliations


Optics Express, Vol. 13, Issue 17, pp. 6519-6526 (2005)
http://dx.doi.org/10.1364/OPEX.13.006519


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Abstract

Scanning Near-field Optical Microscopies suffer from the low signal to noise ratio, due to the smallness of the diffracting probe used to get images. Therefore a lock-in amplifier is commonly used to perform homodyne detection. From the lock-in data, we reconstruct the near-field intensity diffracted by the probe-end in the case of approach curves. We show that the reconstructed and the detected signals can strongly differ. The reconstruction of the signal is necessary to give physical interpretation.

© 2005 Optical Society of America

OCIS Codes
(120.1880) Instrumentation, measurement, and metrology : Detection
(180.5810) Microscopy : Scanning microscopy

ToC Category:
Research Papers

History
Original Manuscript: March 10, 2005
Revised Manuscript: August 11, 2005
Published: August 22, 2005

Citation
Dominique Barchiesi and Thomas Grosges, "Signal reconstruction from a scanning near-field optical microscopy approach curve," Opt. Express 13, 6519-6526 (2005)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-13-17-6519


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