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Optics Express

Optics Express

  • Editor: Micha
  • Vol. 13, Iss. 23 — Nov. 14, 2005
  • pp: 9211–9216

Optical nonlinearity of ZnO microcrystallite enhanced by interfacial state

Y. B. Han, J. B. Han, S. Ding, D. J. Chen, and Q. Q. Wang  »View Author Affiliations


Optics Express, Vol. 13, Issue 23, pp. 9211-9216 (2005)
http://dx.doi.org/10.1364/OPEX.13.009211


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Abstract

A series of ZnO microcrystallite films deposited on quartz substrates were annealed at the temperature of 600~1050 °C. A well c-axis grown wurtzite ZnO film was obtained at the annealing temperature of 850 °C. For the samples annealed above this temperature, the empirical parameter E0 increased calculated from transmittance spectra, which indicated the changes of the interface of ZnO microcrystallite. Measured by Z-scans, the nonlinear absorption coefficient βeff increased from 1.2×102 cm/GW to 1.1×103 cm/GW when the annealing temperature rose from 950 °C to 1050 °C, mainly due to the interfacial state enhancement.

© 2005 Optical Society of America

OCIS Codes
(160.4330) Materials : Nonlinear optical materials
(190.3970) Nonlinear optics : Microparticle nonlinear optics
(240.4350) Optics at surfaces : Nonlinear optics at surfaces

ToC Category:
Research Papers

History
Original Manuscript: September 20, 2005
Revised Manuscript: October 27, 2005
Published: November 14, 2005

Citation
Y. B. Han, J. Han, S. Ding, D. Chen, and Q. Wang, "Optical nonlinearity of ZnO microcrystallite enhanced by interfacial state," Opt. Express 13, 9211-9216 (2005)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-13-23-9211


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