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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 24 — Nov. 28, 2005
  • pp: 9834–9840

Role of metal film thickness on the enhanced transmission properties of a periodic array of subwavelength apertures

Xiang Shou, Amit Agrawal, and Ajay Nahata  »View Author Affiliations


Optics Express, Vol. 13, Issue 24, pp. 9834-9840 (2005)
http://dx.doi.org/10.1364/OPEX.13.009834


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Abstract

We have measured the enhanced transmission properties of periodic arrays of subwavelength apertures fabricated in thin metal films as a function of the metal film thickness. In doing so, we determine the minimum metal film thickness for an array that exhibits resonantly enhanced transmission and observe the transmission properties as the metal film thickness is increased. The thickness range explored extends from δ/15, where δ is the skin depth, to approximately 2δ. Using terahertz time-domain spectroscopy, we measure both the amplitude and phase of the transmitted broadband THz pulses. Experimentally, we find that there is negligible transmission enhancement for metal films as thin as δ/15. As the film thickness increases, there is a sublinear increase in the enhancement until the film thickness is equal to the skin depth. For metal films thicker than one skin depth, there appears to be little additional enhancement at the resonant frequencies. We also observe that as the thickness of metal films increases, there is a corresponding increase in the resonance frequencies.

© 2005 Optical Society of America

OCIS Codes
(050.1220) Diffraction and gratings : Apertures
(240.6680) Optics at surfaces : Surface plasmons
(240.6690) Optics at surfaces : Surface waves
(260.3090) Physical optics : Infrared, far

ToC Category:
Research Papers

History
Original Manuscript: October 19, 2005
Revised Manuscript: October 18, 2005
Published: November 28, 2005

Citation
Xiang Shou, Amit Agrawal, and Ajay Nahata, "Role of metal film thickness on the enhanced transmission properties of a periodic array of subwavelength apertures," Opt. Express 13, 9834-9840 (2005)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-13-24-9834


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References

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