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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 10 — May. 15, 2006
  • pp: 4452–4458

Characterization of nano recorded marks at different writing strategies on phase-change recording layer of optical disks

Shih Kai Lin, I Chun Lin, and Din Ping Tsai  »View Author Affiliations


Optics Express, Vol. 14, Issue 10, pp. 4452-4458 (2006)
http://dx.doi.org/10.1364/OE.14.004452


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Abstract

Conductive-atomic force microscopy has been successfully used for characterizing recorded marks on commercial digital versatile disk and Blu-ray disk. Nano recorded marks beyond diffraction limit are imaged with high spatial resolution and excellent contrast of conductivity. The smallest mark size resolved is around 23.5 nm which is limited by background spots around 18.5 nm. The results of different optical power and writing strategy on the size, shape, and close packed writing process of recorded marks clearly show the opto-thermal response of phase-change recording layer.

© 2006 Optical Society of America

OCIS Codes
(210.4590) Optical data storage : Optical disks
(210.4770) Optical data storage : Optical recording

ToC Category:
Optical Data Storage

History
Original Manuscript: February 27, 2006
Revised Manuscript: May 5, 2006
Manuscript Accepted: May 6, 2006
Published: May 15, 2006

Citation
Shih Kai Lin, I Chun Lin, and Din Ping Tsai, "Characterization of nano recorded marks at different writing strategies on phase-change recording layer of optical disks," Opt. Express 14, 4452-4458 (2006)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-14-10-4452


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