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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 16 — Aug. 7, 2006
  • pp: 7198–7209

Dynamic speckle illumination microscopy with translated versus randomized speckle patterns

Cathie Ventalon and Jerome Mertz  »View Author Affiliations

Optics Express, Vol. 14, Issue 16, pp. 7198-7209 (2006)

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Dynamic speckle illumination (DSI) microscopy is a widefield fluorescence imaging technique that provides depth discrimination. The technique relies on the illumination of a sample with a sequence of speckle patterns. We consider an image processing algorithm based on a differential intensity variance between consecutive images, and demonstrate that DSI sectioning strength depends on the dynamics of the speckle pattern. Translated speckle patterns confer greater sectioning strength than randomized speckle patterns because they retain out-of-focus correlations that lead to better background rejection. We present a theory valid for arbitrary point-spread-functions, which we corroborate with experimental results.

© 2006 Optical Society of America

OCIS Codes
(180.1790) Microscopy : Confocal microscopy
(180.2520) Microscopy : Fluorescence microscopy
(180.6900) Microscopy : Three-dimensional microscopy

ToC Category:

Original Manuscript: June 12, 2006
Revised Manuscript: July 28, 2006
Manuscript Accepted: July 30, 2006
Published: August 7, 2006

Virtual Issues
Vol. 1, Iss. 9 Virtual Journal for Biomedical Optics

Cathie Ventalon and Jerome Mertz, "Dynamic speckle illumination microscopy with translated versus randomized speckle patterns," Opt. Express 14, 7198-7209 (2006)

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