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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 17 — Aug. 21, 2006
  • pp: 7889–7894

X-ray ultramicroscopy using integrated sample cells

Dachao Gao, Stephen W. Wilkins, David J. Parry, Tim E. Gureyev, Peter R. Miller, and Eric Hanssen  »View Author Affiliations


Optics Express, Vol. 14, Issue 17, pp. 7889-7894 (2006)
http://dx.doi.org/10.1364/OE.14.007889


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Abstract

The X-ray ultramicroscope (XuM), based on using a scanning electron microscope as host, provides a new approach to X-ray projection microscopy. The right-angle-type integrated sample cells described here expand the capabilities of the XuM technique. The integrated sample cell combines a target, a spacer, a sample chamber, and an exit window in one physical unit, thereby simplifying the instrumentation and providing increased mechanical stability. The XuM imaging results presented here, obtained using such right-angle integrated sample cells, clearly demonstrate the ability to characterize very small features in objects, down to of order 100nm, including their use for dry, wet and even liquid samples.

© 2006 Optical Society of America

OCIS Codes
(340.7440) X-ray optics : X-ray imaging
(340.7460) X-ray optics : X-ray microscopy

ToC Category:
Microscopy

History
Original Manuscript: June 20, 2006
Revised Manuscript: August 3, 2006
Manuscript Accepted: August 3, 2006
Published: August 21, 2006

Virtual Issues
Vol. 1, Iss. 9 Virtual Journal for Biomedical Optics

Citation
Dachao Gao, Stephen W. Wilkins, David J. Parry, Tim E. Gureyev, Peter R. Miller, and Eric Hanssen, "X-ray ultramicroscopy using integrated sample cells," Opt. Express 14, 7889-7894 (2006)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-14-17-7889


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References

  1. L. Marton, "Internal Report." RCA Laboratories, Princeton, NJ (1939).
  2. M. von Ardenne, "Zur Leistungsfahigkeit des Elektronen-Schattenmikroskopes und uber ein Rontgenstrahlen-Schattenmilkroskop," Naturwiss. 27, 485-486 (1939). [CrossRef]
  3. W. C. Nixon, "Improved resolution with the X-ray projection microscope," Nature 175, 1078-1079 (1955). [CrossRef] [PubMed]
  4. V. E. Cosslett and W.C. Nixon, X-ray Microscopy, (Cambridge Univ. Press, London, 1960).
  5. H. R. F. Horn and H. G. Waltinger, "How to obtain and use X-ray projection microscopy in the SEM." Scanning 1, 100-108 (1978). [CrossRef]
  6. S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, "Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging," J. Microsc. 207, 79-96 (2002). [CrossRef] [PubMed]
  7. S. C. Mayo, T. J. Davis, T. E. Gureyev, P. R. Miller, D. Paganin, A. Pogany, A. W. Stevenson, S. W. Wilkins, "X-ray Phase-Contrast Microscopy and Microtomography," Opt. Express 11, 2289-2302 (2003). [CrossRef] [PubMed]
  8. S. W. Wilkins, "High Resolution X-ray Imaging of Very Small Objects," Australia Patent. Patent number: PO6041 (Apr. 8, 1997);United States Patent. Patent number: 6163590 (Dec. 19, 2000).
  9. J. C. Russ, "The image processing handbook", (CRC Press, Boca Raton, 1995).
  10. M. R. Howells, T Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, J. Miao, D. Sayre, D. A. Shapiro and J. C. H. Spence, physics/0502059, Feb 11, 2005, arxiv/pdf/physics/0502059.

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