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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 19 — Sep. 18, 2006
  • pp: 8476–8481

Force constant calibration corrections for silicon position detectors in the near-infrared

J. H. G. Huisstede, K. O. van der Werf, M. L. Bennink, and V. Subramaniam  »View Author Affiliations

Optics Express, Vol. 14, Issue 19, pp. 8476-8481 (2006)

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The accurate calibration of the force constant of the probe in atomic force microscopy and optical tweezers applications is extremely important for force spectroscopy. The commonly used silicon detectors exhibit a complex transfer function for wavelengths >850 nm, which limits the detection bandwidth leading to serious errors in the force constant determination. We show that this low-pass effect can be compensated for using the frequency response of the detector. This is applicable for calibrations in both atomic force microscopy and optical tweezers. For optical tweezers an additional correction method is discussed based on fitting an expression in which the low-pass characteristics are already accounted for.

© 2006 Optical Society of America

OCIS Codes
(040.5160) Detectors : Photodetectors
(040.6040) Detectors : Silicon
(230.0250) Optical devices : Optoelectronics
(230.5160) Optical devices : Photodetectors

ToC Category:

Original Manuscript: March 28, 2006
Revised Manuscript: September 8, 2006
Manuscript Accepted: September 8, 2006
Published: September 18, 2006

Virtual Issues
Vol. 1, Iss. 10 Virtual Journal for Biomedical Optics

J. H. G. Huisstede, K. O. van der Werf, M. L. Bennink, and V. Subramaniam, "Force constant calibration corrections for silicon position detectors in the near-infrared," Opt. Express 14, 8476-8481 (2006)

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