Imaging interferometric microscopy–approaching the linear systems limits of optical resolution.
Optics Express, Vol. 15, Issue 11, pp. 6651-6663 (2007)
http://dx.doi.org/10.1364/OE.15.006651
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Abstract
The linear systems optical resolution limit is a dense grating pattern at a λ/2 pitch or a critical dimension (resolution) of λ/4. However, conventional microscopy provides a (Rayleigh) resolution of only ~ 0.6λ/NA, approaching λ/1.67 as NA → 1. A synthetic aperture approach to reaching the λ/4 linear-systems limit, extending previous developments in imaging-interferometric microscopy, is presented. Resolution of non-periodic 180-nm features using 633-nm illumination (λ/3.52) and of a 170-nm grating (λ/3.72) is demonstrated. These results are achieved with a 0.4-NA optical system and retain the working distance, field-of-view, and depth-of-field advantages of low-NA systems while approaching ultimate resolution limits.
© 2007 Optical Society of America
OCIS Codes
(180.0180) Microscopy : Microscopy
ToC Category:
Microscopy
History
Original Manuscript: March 14, 2007
Revised Manuscript: May 5, 2007
Manuscript Accepted: May 5, 2007
Published: May 15, 2007
Virtual Issues
Vol. 2, Iss. 6 Virtual Journal for Biomedical Optics
Citation
Yuliya Kuznetsova, Alexander Neumann, and S. R. Brueck, "Imaging interferometric microscopy–approaching the linear systems limits of optical resolution.," Opt. Express 15, 6651-6663 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-11-6651
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