Surface enhanced ellipsometric contrast (SEEC) basic theory and λ/4 multilayered solutions
Optics Express, Vol. 15, Issue 13, pp. 8329-8339 (2007)
http://dx.doi.org/10.1364/OE.15.008329
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Abstract
The fundamentals of a new high contrast technique for optical microscopy, named “Surface Enhanced Ellipsometric Contrast” (SEEC), are presented. The technique is based on the association of enhancing contrast surfaces as sample stages and microscope observation between cross polarizers. The surfaces are designed to become anti-reflecting when used in these conditions. They are defined by the simple equation rp + rs = 0 between their two Fresnel coefficients. Most often, this equation can be met by covering a solid surface with a single λ/4 layer with a well defined refractive index. A higher flexibility is obtained with multilayer stacks. Solutions with an arbitrary number of all-dielectric λ/4 layers are derived.
© 2007 Optical Society of America
OCIS Codes
(180.0180) Microscopy : Microscopy
(240.0240) Optics at surfaces : Optics at surfaces
(260.0260) Physical optics : Physical optics
(310.0310) Thin films : Thin films
ToC Category:
Microscopy
History
Original Manuscript: December 14, 2006
Revised Manuscript: April 23, 2007
Manuscript Accepted: April 24, 2007
Published: June 18, 2007
Virtual Issues
Vol. 2, Iss. 7 Virtual Journal for Biomedical Optics
Citation
D Ausserré and M.-P. Valignat, "Surface enhanced ellipsometric contrast (SEEC) basic theory and λ/4 multilayered solutions," Opt. Express 15, 8329-8339 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-13-8329
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References
- T. Sandström, M. Stenberg, and H. Nygren, "Visual detection of organic monomolecular films by interference colors," Appl. Opt. 24,472-479 (1985). [CrossRef] [PubMed]
- D. Ausserré, A.-M. Picart and L. Léger, "Existence and role of the precursor film in the spreading of polymer liquids," Phys. Rev. Lett. 57,2671-2674 (1986). [CrossRef] [PubMed]
- D. Ausserré, and M.-P. Valignat, "Wide field optical imaging of surface nanostructures," Nano Lett. 6,1384-1388 (2006). [CrossRef] [PubMed]
- A. Musset and A. Thelen, "Multilayer antireflection coating," in Progress in Optics, E. Wolf, ed., (North Holland Publ. Co., Amsterdam, 1970) Vol. 8 p. 201-237. [CrossRef]
- J. T. Cox and G. Hass "Antireflection coatings for optical and infrared materials," in Physics of Thin Films, G. Hass and R.E. Thun, eds., (Academic Press, New York, 1968), Vol. 2 p. 239.
- R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light, (Elsevier, Amsterdam 1987).
- G. B. Airy, Phil. Mag. 2, 20 (1833).
- L. G. Parratt, "Surface studies of solids by total reflection of X-Rays," Phys. Rev. 95, 359-369 (1954). [CrossRef]
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