Group delay dispersion measurement of Yb:Gd2SiO5, Yb:GdYSiO5 and Yb:LuYSiO5crystal with white-light interferometry
Optics Express, Vol. 15, Issue 13, pp. 8486-8491 (2007)
http://dx.doi.org/10.1364/OE.15.008486
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Abstract
We report the measured group delay dispersion (GDD) of new crystals Yb:Gd2SiO5 (Yb:GSO), Yb:GdYSiO5 (Yb:GYSO) and Yb:LuYSiO5 (Yb:LYSO) over wavelengths from 1000nm to 1200nm, with a white-light interferometer. Those GDD data should be useful for the dispersion compensation for femtosecond pulse generation in the lasers with these new crystals as the gain media.
© 2007 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(140.3380) Lasers and laser optics : Laser materials
(140.7090) Lasers and laser optics : Ultrafast lasers
ToC Category:
Lasers and Laser Optics
History
Original Manuscript: May 10, 2007
Revised Manuscript: June 13, 2007
Manuscript Accepted: June 13, 2007
Published: June 22, 2007
Citation
Weijian Yang, Jing Li, Fan Zhang, Yuanyang Zhang, Zhigang Zhang, Guangjun Zhao, Lihe Zheng, Jun Xu, and Liangbi Su, "Group delay dispersion measurement of Yb:Gd2SiO5, Yb:GdYSiO5 and Yb:LuYSiO5crystal with white-light interferometry," Opt. Express 15, 8486-8491 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-13-8486
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References
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