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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 15 — Jul. 23, 2007
  • pp: 9659–9665

Linewidth properties of double-layer surfacerelief resonant Brewster filters with equal refractive index

Tian Sang, Zhanshan Wang, Jingtao Zhu, Li Wang, Yonggang Wu, and Lingyan Chen  »View Author Affiliations


Optics Express, Vol. 15, Issue 15, pp. 9659-9665 (2007)
http://dx.doi.org/10.1364/OE.15.009659


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Abstract

In this paper, double-layer surface-relief resonant Brewster filters consisting of a homogenous layer and a grating with equal refractive index are obtained by adjusting the grating filling factor, and linewidth properties of these types of filters are investigated. It is shown etch depth error does not change the filter linewidth, but the grating filling factor and the substrate refractive index can significantly change the filter linewidth. Moreover, the coupling strength can be appreciately affected by the homogeneous layer thickness, and one can obtain different linewidths at the same operating wavelength by selecting different homogeneous layer thickness with other physical parameters maintained.

© 2007 Optical Society of America

OCIS Codes
(050.0050) Diffraction and gratings : Diffraction and gratings
(050.1970) Diffraction and gratings : Diffractive optics
(310.0310) Thin films : Thin films
(310.2790) Thin films : Guided waves

ToC Category:
Diffraction and Gratings

History
Original Manuscript: May 9, 2007
Revised Manuscript: July 13, 2007
Manuscript Accepted: July 14, 2007
Published: July 19, 2007

Citation
Tian Sang, Zhanshan Wang, Jingtao Zhu, Li Wang, Yonggang Wu, and Lingyan Chen, "Linewidth properties of double-layer surface-relief resonant Brewster filters with equal refractive index," Opt. Express 15, 9659-9665 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-15-9659


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