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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 15 — Jul. 23, 2007
  • pp: 9748–9754

Ultrashort pulse characterization by ultra-thin ZnO, GaN, and AlN crystals

Yohei Kobayashi, Dai Yoshitomi, Kakuya Iwata, Hideyuki Takada, and Kenji Torizuka  »View Author Affiliations


Optics Express, Vol. 15, Issue 15, pp. 9748-9754 (2007)
http://dx.doi.org/10.1364/OE.15.009748


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Abstract

Ultra-thin semiconductor crystals were investigated as nonlinear materials for second-harmonic generation. Nonlinear susceptibilities of sub-micrometer-thick ZnO, GaN, and AlN crystals were measured, and these crystals were used for sub-10-fs pulse measurement by a fringe-resolved autocorrelation method. We found that a one-cycle pulse could be characterized by using these ultra-thin-film crystals.

© 2007 Optical Society of America

OCIS Codes
(310.6860) Thin films : Thin films, optical properties
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7110) Ultrafast optics : Ultrafast nonlinear optics

ToC Category:
Ultrafast Optics

History
Original Manuscript: June 4, 2007
Revised Manuscript: July 16, 2007
Manuscript Accepted: July 18, 2007
Published: July 20, 2007

Citation
Yohei Kobayashi, Dai Yoshitomi, Kakuya Iwata, Hideyuki Takada, and Kenji Torizuka, "Ultrashort pulse characterization by ultra-thin ZnO, GaN, and AlN crystals," Opt. Express 15, 9748-9754 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-15-9748


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