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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 20 — Oct. 1, 2007
  • pp: 13351–13359

Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor

Zhi-Bo Liu, Xiao-Qing Yan, Jian-Guo Tian, Wen-Yuan Zhou, and Wei-Ping Zang  »View Author Affiliations


Optics Express, Vol. 15, Issue 20, pp. 13351-13359 (2007)
http://dx.doi.org/10.1364/OE.15.013351


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Abstract

We present a method that combines the Z-scan technique with nonlinear ellipse rotation (NER) to measure third-order nonlinear susceptibility components. The experimental details are demonstrated, and a comprehensive theoretical analysis is given. The validity of this method is verified by the measurements of the nonlinear susceptibility tensor of a well-characterized liquid, CS2.

© 2007 Optical Society of America

OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(190.3270) Nonlinear optics : Kerr effect
(190.4710) Nonlinear optics : Optical nonlinearities in organic materials

ToC Category:
Nonlinear Optics

History
Original Manuscript: July 23, 2007
Revised Manuscript: September 4, 2007
Manuscript Accepted: September 4, 2007
Published: September 28, 2007

Citation
Zhi-Bo Liu, Xiao-Qing Yan, Jian-Guo Tian, Wen-Yuan Zhou, and Wei-Ping Zang, "Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor," Opt. Express 15, 13351-13359 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-20-13351


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References

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