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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 24 — Nov. 26, 2007
  • pp: 16090–16096

Ultra-High Q/V Fabry-Perot microcavity on SOI substrate

P. Velha, E. Picard, T. Charvolin, E. Hadji, J. C. Rodier, P. Lalanne, and D. Peyrade  »View Author Affiliations


Optics Express, Vol. 15, Issue 24, pp. 16090-16096 (2007)
http://dx.doi.org/10.1364/OE.15.016090


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Abstract

We experimentally demonstrate an ultra high Q/V nanocavity on SOI substrate. The design is based on modal adaptation within the cavity and allows to measure a quality factor of 58.000 for a modal volume of 0.6(λ/n)3. This record Q/V value of 105 achieved for a structure standing on a physical substrate, rather than on membrane, is in very good agreement with theoretical predictions also shown. Based on these experimental results, we show that further refinements of the cavity design could lead to Q/V ratios close to 106.

© 2007 Optical Society of America

OCIS Codes
(130.0130) Integrated optics : Integrated optics
(250.5300) Optoelectronics : Photonic integrated circuits
(230.5298) Optical devices : Photonic crystals
(130.7408) Integrated optics : Wavelength filtering devices

ToC Category:
Integrated Optics

History
Original Manuscript: August 8, 2007
Revised Manuscript: October 11, 2007
Manuscript Accepted: October 14, 2007
Published: November 20, 2007

Citation
P. Velha, E. Picard, T. Charvolin, E. Hadji, J.C. Rodier, P. Lalanne, and D. Peyrade, "Ultra-High Q/V Fabry-Perot microcavity on SOI substrate," Opt. Express 15, 16090-16096 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-24-16090


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