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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 3 — Feb. 5, 2007
  • pp: 1286–1291

Negative refraction imaging in a hybrid photonic-crystal device at near-infrared frequencies

Zhaolin Lu, Binglin Miao, Timothy R. Hodson, Chunchen Lin, Janusz A. Murakowski, and Dennis W. Prather  »View Author Affiliations


Optics Express, Vol. 15, Issue 3, pp. 1286-1291 (2007)
http://dx.doi.org/10.1364/OE.15.001286


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Abstract

We present the experimental demonstration of imaging of a point source by negative refraction at near-infrared frequencies using a hybrid photonic crystal device. The photonic crystal device, fabricated by patterning holes in 260nm silicon-on-insulator, integrates a triangular-lattice photonic crystal with a large photonic bandgap and square-lattice photonic crystal with negative refraction. Experimental results show that the output of a line-defect photonic bandgap waveguide provides a nearly ideal point source and then is imaged through the photonic crystal by negative refraction.

© 2007 Optical Society of America

OCIS Codes
(100.6640) Image processing : Superresolution
(130.3120) Integrated optics : Integrated optics devices
(160.4760) Materials : Optical properties
(220.3620) Optical design and fabrication : Lens system design

ToC Category:
Photonic Crystals

History
Original Manuscript: December 19, 2006
Revised Manuscript: January 17, 2007
Manuscript Accepted: January 17, 2007
Published: February 5, 2007

Citation
Zhaolin Lu, Binglin Miao, Timothy R. Hodson, Chunchen Lin, Janusz A. Murakowski, and Dennis W. Prather, "Negative refraction imaging in a hybrid photonic crystal device at near-infrared frequencies," Opt. Express 15, 1286-1291 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-3-1286


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References

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