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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 10 — May. 12, 2008
  • pp: 7453–7459

Nanoscale depth resolution in scanning near-field infrared microscopy

Götz Wollny, Erik Bründermann, Zoran Arsov, Luca Quaroni, and Martina Havenith  »View Author Affiliations


Optics Express, Vol. 16, Issue 10, pp. 7453-7459 (2008)
http://dx.doi.org/10.1364/OE.16.007453


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Abstract

We have recorded nanoscale topography and infrared chemical fingerprints of attomole layered lipids consisting of dimyristoylphosphatidylcholine on silicon and mica. Lipids deposited on mica built stacks consisting of up to 25 bilayers, each approximately 5 nm thick, spanning a range from 5–125 nm in height. Contrast evaluation as a function of layer thickness provides the near-field depth resolution.

© 2008 Optical Society of America

OCIS Codes
(110.3080) Imaging systems : Infrared imaging
(180.5810) Microscopy : Scanning microscopy
(300.6340) Spectroscopy : Spectroscopy, infrared

ToC Category:
Microscopy

History
Original Manuscript: February 27, 2008
Revised Manuscript: April 13, 2008
Manuscript Accepted: April 30, 2008
Published: May 8, 2008

Virtual Issues
Vol. 3, Iss. 6 Virtual Journal for Biomedical Optics

Citation
Götz Wollny, Erik Bründermann, Zoran Arsov, Luca Quaroni, and Martina Havenith, "Nanoscale depth resolution in scanning near-field infrared microscopy," Opt. Express 16, 7453-7459 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-10-7453


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