OSA's Digital Library

Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 13 — Jun. 23, 2008
  • pp: 9513–9518

Full mapping of optical noise in photonic devices: an evaluation by near-field scanning microscopy

Jean-Marie Moison, Izo Abram, and Marcel Bensoussan  »View Author Affiliations


Optics Express, Vol. 16, Issue 13, pp. 9513-9518 (2008)
http://dx.doi.org/10.1364/OE.16.009513


View Full Text Article

Enhanced HTML    Acrobat PDF (378 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We demonstrate the possibility of mapping the transverse spatial distribution of optical noise at the output of photonic devices. Maps of local low-frequency noise are obtained by using statistics on multiple-sampling data from near-field scanning optical microscopy (NSOM). On selected laser diodes, the signatures of basic types of transverse mode instabilities (relative phase and amplitude of modes) are unambiguously obtained. On more complex systems, the types of mode instability can be identified and their intensity can be monitored. Such noise mapping opens a new path for analyzing noise origins and for optimizing device design.

© 2008 Optical Society of America

OCIS Codes
(140.2020) Lasers and laser optics : Diode lasers
(270.2500) Quantum optics : Fluctuations, relaxations, and noise

ToC Category:
Lasers and Laser Optics

History
Original Manuscript: January 22, 2008
Revised Manuscript: March 1, 2008
Manuscript Accepted: March 20, 2008
Published: June 13, 2008

Citation
Jean-Marie Moison, Izo Abram, and Marcel Bensoussan, "Full mapping of optical noise in photonic devices: an evaluation by near-field scanning microscopy," Opt. Express 16, 9513-9518 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-13-9513


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. J. Ph. Poizat, T. Chang, and Ph. Grangier, "Quantum intensity noise of laser diodes and nonorthogonal spatial eigenmodes," Phys. Rev. A 61, 043807-11 (2000). [CrossRef]
  2. B. Schmidt, N. Lichtenstein, B. Sverdlov, N. Matuschek, S. Mohrdiek, T. Pliska, J. Mueller, S. Pawlik, S. Arlt, H. U. Pfeiffer, A. Fily, and C. Harder, " Further development of high-power pump laser diodes," Proc. SPIE 5248, 42-54 (2003). [CrossRef]
  3. J. P. Wilde, A. A. Tselikov, G. R. Gray, Y. Zhang, and S. Gangopadhyay, "Magneto-optical disk drive technology using multiple fiber-coupled flying optical heads. Part II. Laser noise considerations," Appl. Opt. 41, 884-894 (2002). [CrossRef] [PubMed]
  4. K. Peterman, Laser diode modulation and noise (Klüwer, Dordrecht 1991).
  5. F. Wölfl, J. F. Ryan, A. M. Fox, A. D. Ashmore, D. J. Mowbray, M. S. Skolnick, M. Hopkinson, and G. Hill, "Intensity noise in quantum-dot laser diodes," Appl. Phys. Lett. 78, 3577-3579 (2001). [CrossRef]
  6. K. Haneda, M. Yoshida, M. Nakazawa, H. Yokohama, and Y. Ogawa, "Linewidth and relative intensity noise measurements of longitudinal modes in ultrahigh-speed mode-locked laser diodes," Opt.Lett. 30, 1000-1002 (2005). [CrossRef] [PubMed]
  7. J. Ph. Poizat, T. Chang, O. Ripoll, and Ph. Grangier, "Spatial quantum noise of laser diodes," J. Opt. Soc. Am. B 15, 1757-1761 (1998). [CrossRef]
  8. A. Bramati, J. P. Hermier, A. Z. Khoury, E. Giacobino, P. Schnitzer, R. Michalzik, K. J. Ebeling, J.Ph. Poizat, and Ph. Grangier, "Spatial distribution of the intensity noise of a vertical-cavity surface-emitting semiconductor laser," Opt. Lett. 24, 893-895 (1999). [CrossRef]
  9. C. L. Garrido Alzar, S. M. de Paula, M. Martinelli, R. J. Horowicz, A. Z. Khoury, and G. A. Barbosa, "Transverse Fourier analysis of squeezed light in diode lasers," J. Opt. Soc. Am. B 18, 1189-1195 (2001). [CrossRef]
  10. P. Kappe, J. Kaiser, and W. Elssäser, "Spatially correlated light emission from a resonant-cavity light-emitting diode," Opt. Lett. 28, 49-51 (2003). [CrossRef] [PubMed]
  11. S. Bourzeix, J. M. Moison, F. Mignard, F. Barthe, A. C. Boccara, C. Licoppe, B. Mersali, M. Allovon, and A. Bruno, "Near-field optical imaging of light propagation in semiconductor waveguide structures," Appl. Phys. Lett. 73, 1035-1037 (1998). [CrossRef]
  12. N. G. Van Kampen, Stochastic Processes in Physics and Chemistry (North Holland, Amsterdam 1981).
  13. I. Joindot, "Measurement of relative intensity noise (RIN) in semiconductor lasers," J. Phys. III France 2, 1591-1603 (1992). [CrossRef]
  14. F. Dross, F. Van Dijk, O. Parillaud, B. Vinter, and N. Vodjdani, "Single-transverse-mode InGaAsP/InP edge-emitting bipolar cascade laser," IEEE J. Quantum Electron. 41, 1356-1360 (2005); [CrossRef]
  15. F. Dross, F. van Dijk and Ph. Gallion, "Discussion on the improvement of opto-RF link properties by using a bipolar cascade laser source," IET Optoelectronics 1, 9-15 (2007). [CrossRef]
  16. T. Gensty, W. Elsä??er, and C. Mann, "Intensity noise properties of quantum cascade lasers," Opt. Express 13, 2032-2039 (2005), http://www.opticsexpress.org/abstract.cfm?URI=OPEX-13-6-2032. [CrossRef] [PubMed]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited