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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 13 — Jun. 23, 2008
  • pp: 9654–9670

Controlling the shape of Talbot bands’ visibility

Daniel Woods and Adrian Podoleanu  »View Author Affiliations


Optics Express, Vol. 16, Issue 13, pp. 9654-9670 (2008)
http://dx.doi.org/10.1364/OE.16.009654


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Abstract

We present a theoretical model to predict the sensitivity variation versus optical path difference (OPD) in Fourier domain spectral interferometry using configurations which produce Talbot bands. Such configurations require that the two interfering beams use different parts of the diffraction grating in the interrogating spectrometer. So far, the power distribution within the two beams in a Talbot bands experiment was considered uniform. In this report, we show that by manipulating the power distribution within the two interfering beams, the OPD value where maximum sensitivity is achieved can be conveniently tuned, as well as the sensitivity variation with OPD. Furthermore, creating a gap between the two beams leads to adjustment of the minimum detectable OPD value, while the width of the beams determine the maximum detectable OPD value. These features cannot be explained by theoretical models published so far involving spectrometer resolution elements only, while such features are correctly predicted by the model presented here.

© 2008 Optical Society of America

OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: April 21, 2008
Revised Manuscript: June 11, 2008
Manuscript Accepted: June 13, 2008
Published: June 16, 2008

Virtual Issues
Vol. 3, Iss. 7 Virtual Journal for Biomedical Optics

Citation
Daniel Woods and Adrian Podoleanu, "Controlling the shape of Talbot bands' visibility," Opt. Express 16, 9654-9670 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-13-9654


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