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Optics Express

Optics Express

  • Vol. 16, Iss. 16 — Aug. 4, 2008
  • pp: 12415–12422

Statistical parameters and analysis of local contrast gloss

Antti Oksman, Mikko Juuti, and Kai-Erik Peiponen  »View Author Affiliations


Optics Express, Vol. 16, Issue 16, pp. 12415-12422 (2008)
http://dx.doi.org/10.1364/OE.16.012415


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Abstract

Recently, we introduced a sensor for the detection of local contrast gloss (or luster) of products. This is a new development step in contrast gloss measurement, since contrast gloss has been measured previously from a macroscopic area. Therefore, yet there do not exist statistical parameters for the classification of the contrast gloss as there exist parameters, e.g., for the classification of the surface roughness. In this study, we define novel statistical parameters for the diffuse component and contrast gloss obtained by the sensor for the detection of local contrast gloss. As an example, we utilize these statistical parameters and measured specular gloss, diffuse-component, and contrast gloss maps in the characterization of prints.

© 2008 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5700) Instrumentation, measurement, and metrology : Reflection

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 4, 2008
Revised Manuscript: July 14, 2008
Manuscript Accepted: July 15, 2008
Published: August 1, 2008

Citation
Antti Oksman, Mikko Juuti, and Kai-Erik Peiponen, "Statistical parameters and analysis of local contrast gloss," Opt. Express 16, 12415-12422 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-16-12415


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