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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 17 — Aug. 18, 2008
  • pp: 13218–13224

Whispering-gallery modes and light emission from a Si-nanocrystal-based single microdisk resonator

Mher Ghulinyan, Daniel Navarro-Urrios, Alessandro Pitanti, Alberto Lui, Georg Pucker, and Lorenzo Pavesi  »View Author Affiliations

Optics Express, Vol. 16, Issue 17, pp. 13218-13224 (2008)

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We report on visible light emission from Si-nanocrystal based optically active microdisk resonators. The room temperature photoluminescence (PL) from single microdisks shows the characteristic modal structure of whispering-gallery modes. The emission is both TE and TM-polarized in 300 nm thick microdisks, while thinner ones (135 nm) support only TE-like modes. Thinner disks have the advantage to filter out higher order radial mode families, allowing for measuring only the most intense first order modal structure. We reveal subnanometer linewidths and corresponding quality factors as high as 2800, limited by the spectral resolution of the experimental setup. Moreover, we observe a modification of mode linewidth by a factor 13 as a function of pump power. The origin of this effect is attributed to an excited carrier absorption loss mechanism.

© 2008 Optical Society of America

OCIS Codes
(230.1150) Optical devices : All-optical devices
(230.5750) Optical devices : Resonators
(250.5230) Optoelectronics : Photoluminescence
(140.3948) Lasers and laser optics : Microcavity devices

ToC Category:
Optical Devices

Original Manuscript: June 6, 2008
Revised Manuscript: August 4, 2008
Manuscript Accepted: August 5, 2008
Published: August 13, 2008

Mher Ghulinyan, Daniel Navarro-Urrios, Alessandro Pitanti, Alberto Lui, Georg Pucker, and Lorenzo Pavesi, "Whispering-gallery modes and light emission from a Si-nanocrystal-based single microdisk resonator," Opt. Express 16, 13218-13224 (2008)

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  17. The PL spectra collected vertically to the disk plane show only the characteristic nc-Si emission band. The absence of WGM lines implies a significantly low surface scattering and confirms the high surface quality of microdisks.
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  22. The quality of fit to ellipsometric data saturates down to values |2 ¡« 0.1 for loss coefficients smaller than �?�0 =30 cm-1.
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