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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 24 — Nov. 24, 2008
  • pp: 19493–19503

Numerical method for high accuracy index of refraction estimation for spectro-angular surface plasmon resonance systems

Colin J. Alleyne, Andrew G. Kirk, Wei-Yin Chien, and Paul G. Charette  »View Author Affiliations


Optics Express, Vol. 16, Issue 24, pp. 19493-19503 (2008)
http://dx.doi.org/10.1364/OE.16.019493


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Abstract

An eigenvector analysis based algorithm is presented for estimating refractive index changes from 2-D reflectance/dispersion images obtained with spectro-angular surface plasmon resonance systems. High resolution over a large dynamic range can be achieved simultaneously. The method performs well in simulations with noisy data maintaining an error of less than 10-8 refractive index units with up to six bits of noise on 16bit quantized image data. Experimental measurements show that the method results in a much higher signal to noise ratio than the standard 1-D weighted centroid dip finding algorithm.

© 2008 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(130.6010) Integrated optics : Sensors
(240.6680) Optics at surfaces : Surface plasmons
(260.3910) Physical optics : Metal optics

ToC Category:
Optics at Surfaces

History
Original Manuscript: September 11, 2008
Revised Manuscript: November 2, 2008
Manuscript Accepted: November 5, 2008
Published: November 10, 2008

Citation
Colin J. Alleyne, Andrew G. Kirk, Wei-Yin Chien, and Paul G. Charette, "Numerical method for high accuracy index of refraction estimation for spectro-angular surface plasmon resonance systems," Opt. Express 16, 19493-19503 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-24-19493


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