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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 5 — Mar. 3, 2008
  • pp: 3223–3241

Some simple rules for contrast, signal-to-noise and resolution in in-line x-ray phase-contrast imaging

Timur E. Gureyev, Yakov I. Nesterets, Andrew W. Stevenson, Peter R. Miller, Andrew Pogany, and Stephen W. Wilkins  »View Author Affiliations

Optics Express, Vol. 16, Issue 5, pp. 3223-3241 (2008)

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Simple analytical expressions are derived for the spatial resolution, contrast and signal-to-noise in X-ray projection images of a generic phase edge. The obtained expressions take into account the maximum phase shift generated by the sample and the sharpness of the edge, as well as such parameters of the imaging set-up as the wavelength spectrum and the size of the incoherent source, the source-to-object and object-to-detector distances and the detector resolution. Different asymptotic behavior of the expressions in the cases of large and small Fresnel numbers is demonstrated. The analytical expressions are compared with the results of numerical simulations using Kirchhoff diffraction theory, as well as with experimental X-ray measurements.

© 2008 Optical Society of America

OCIS Codes
(110.2960) Imaging systems : Image analysis
(110.2990) Imaging systems : Image formation theory
(110.4980) Imaging systems : Partial coherence in imaging
(340.7440) X-ray optics : X-ray imaging

ToC Category:
X-ray Optics

Original Manuscript: November 21, 2007
Revised Manuscript: February 15, 2008
Manuscript Accepted: February 17, 2008
Published: February 22, 2008

Timur E. Gureyev, Yakov I. Nesterets, Andrew W. Stevenson, Peter R. Miller, Andrew Pogany, and Stephen W. Wilkins, "Some simple rules for contrast, signal-to-noise and resolution in in-line x-ray phase-contrast imaging," Opt. Express 16, 3223-3241 (2008)

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