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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 9 — Apr. 28, 2008
  • pp: 5997–6007

Absorption-sensitive diffuse reflection imaging of concealed powders using a terahertz quantum cascade laser

Paul Dean, Muhammad U. Shaukat, Suraj P. Khanna, Subhasish Chakraborty, Mohammad Lachab, Andrew Burnett, Giles Davies, and Edmund H. Linfield  »View Author Affiliations


Optics Express, Vol. 16, Issue 9, pp. 5997-6007 (2008)
http://dx.doi.org/10.1364/OE.16.005997


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Abstract

We report diffuse reflection imaging in air of concealed powdered samples using a terahertz quantum cascade laser. The sensitivity of the detection scheme to sub-surface absorption within samples is confirmed using fully-characterized powdered admixtures of polystyrene and polymethyl methacrylate (PMMA). Measurements of the backscattering intensity from these samples are then used in conjunction with Kubelka-Munk scattering theory, as well as several models based on the quasi-crystalline approximation, to extract the absorption coefficient of PMMA. Our research demonstrates the feasibility of high-resolution frequency-domain terahertz imaging for the detection and identification of concealed powders in a reflection geometry.

© 2008 Optical Society of America

OCIS Codes
(300.1030) Spectroscopy : Absorption
(140.5965) Lasers and laser optics : Semiconductor lasers, quantum cascade
(110.6795) Imaging systems : Terahertz imaging
(280.1350) Remote sensing and sensors : Backscattering

ToC Category:
Imaging Systems

History
Original Manuscript: February 1, 2008
Revised Manuscript: March 5, 2008
Manuscript Accepted: March 5, 2008
Published: April 14, 2008

Virtual Issues
Vol. 3, Iss. 5 Virtual Journal for Biomedical Optics

Citation
Paul Dean, Muhammad U. Shaukat, Suraj P. Khanna, Subhasish Chakraborty, Mohammad Lachab, Andrew Burnett, Giles Davies, and Edmund H. Linfield, "Absorption-sensitive diffuse reflection imaging of concealed powders using a terahertz quantum cascade laser," Opt. Express 16, 5997-6007 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-9-5997


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