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Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses
J. Chalupský, L. Juha, V. Hájková, J. Cihelka, L. Vyšín, J. Gautier, J. Hajdu, S. P. Hau-Riege, M. Jurek, J. Krzywinski, R. A. London, E. Papalazarou, J. B. Pelka, G. Rey, S. Sebban, R. Sobierajski, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, C. Valentin, H. Wabnitz, and P. Zeitoun »View Author Affiliations
1Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8, Czech Republic
2Czech Technical University in Prague, Zikova 4, 166 36 Praha 1, Czech Republic
3Laboratoire d’Optique Appliquée, École Polytechnique, ENSTA, CNRS, F-91761 Palaiseau, France
4Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, D-22603 Hamburg, Germany
5Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, PL-02-668 Warsaw, Poland
6Biomedical Centre, Uppsala University, Uppsala, SE-75124 Sweden
7Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, CA 94550, USA
*chal@fzu.cz ;
Optics Express, Vol. 17, Issue 1, pp. 208-217 (2009)
http://dx.doi.org/10.1364/OE.17.000208
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Abstract
We report the first observation of single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly (methyl methacrylate) - PMMA. Irradiated by the focused beam from the Free-electron LASer in Hamburg (FLASH) at 21.7nm, the samples have been investigated by atomic-force microscope (AFM) enabling the visualization of mild surface modifications caused by the desorption. A model describing non-thermal desorption and ablation has been developed and used to analyze single-shot imprints in PMMA. An intermediate regime of materials removal has been found, confirming model predictions. We also report below-threshold multiple-shot desorption of PMMA induced by high-order harmonics (HOH) at 32nm. Short-time exposure imprints provide sufficient information about transverse beam profile in HOH’s tight focus whereas long-time exposed PMMA exhibits radiation-initiated surface hardening making the beam profile measurement infeasible.
© 2009 Optical Society of America
OCIS Codes
(140.2600) Lasers and laser optics : Free-electron lasers (FELs)
(140.3330) Lasers and laser optics : Laser damage
(140.7240) Lasers and laser optics : UV, EUV, and X-ray lasers
ToC Category:
Lasers and Laser Optics
History
Original Manuscript: November 4, 2008
Revised Manuscript: December 5, 2008
Manuscript Accepted: December 11, 2008
Published: December 24, 2008
Citation
J. Chalupský, L. Juha, V. Hájková, J. Cihelka, L. Vyšín, J. Gautier, J. Hajdu, S. P. Hau-Riege, M. Jurek, J. Krzywinski, R. A. London, E. Papalazarou, J. B. Pelka, G. Rey, S. Sebban, R. Sobierajski, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, C. Valentin, H. Wabnitz, and P. Zeitoun, "Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses," Opt. Express 17, 208-217 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-1-208
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