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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 13 — Jun. 22, 2009
  • pp: 10881–10886

Endface reflectivities of optical nanowires

Shanshan Wang, Zhifang Hu, Huakang Yu, Wei Fang, Min Qiu, and Limin Tong  »View Author Affiliations

Optics Express, Vol. 17, Issue 13, pp. 10881-10886 (2009)

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Endface reflectivities (ERs) of optical nanowires are investigated using three-dimensional finite-difference time-domain simulations. Typical ERs of both free-standing and substrate-supported silica, tellurite, PMMA and semiconductor nanowires or nanofibers are obtained. Unlike in conventional waveguides such as optical fibers, ERs of nanowires are usually considerably lower when operated in single mode. Dependences of ER on the diameter and the refractive index of the nanowire, and the wavelength of the guided light are also investigated. These results are helpful for estimating and understanding ERs in optical nanowires with diameters close to or smaller than the wavelengths of the light, and may offer valuable references for practical applications such as nanowire or nanofiber-based resonators and lasers.

© 2009 OSA

OCIS Codes
(060.2310) Fiber optics and optical communications : Fiber optics
(230.7370) Optical devices : Waveguides
(350.3950) Other areas of optics : Micro-optics

ToC Category:
Optical Devices

Original Manuscript: May 1, 2009
Revised Manuscript: June 9, 2009
Manuscript Accepted: June 9, 2009
Published: June 15, 2009

Shanshan Wang, Zhifang Hu, Huakang Yu, Wei Fang, Min Qiu, and Limin Tong, "Endface reflectivities of optical nanowires," Opt. Express 17, 10881-10886 (2009)

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