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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 13 — Jun. 22, 2009
  • pp: 10959–10969

Multiple path length dual polarization interferometry

Paul D. Coffey, Marcus J. Swann, Thomas A. Waigh, Fred Schedin, and Jian R. Lu  »View Author Affiliations


Optics Express, Vol. 17, Issue 13, pp. 10959-10969 (2009)
http://dx.doi.org/10.1364/OE.17.010959


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Abstract

An optical sensor for quantitative analysis of ultrathin films and adsorbed layers is described. Quantification of both layer thickness and refractive index (density) can be made for in situ and ex-situ coated films. With the use of two polarizations, in situ measurements are made via one path length in a young’s interferometer arrangement while ex-situ measurements use multiple path lengths. The multiple path length young’s interferometer arrangement is embodied in a solid state waveguide configuration called the multiple path length dual polarization interferometer (MPL-DPI). The technique is demonstrated with ultrathin layers of poly(methylmethacrylate) and human serum albumin.

© 2009 OSA

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(230.7400) Optical devices : Waveguides, slab
(240.6700) Optics at surfaces : Surfaces
(310.6860) Thin films : Thin films, optical properties
(280.1415) Remote sensing and sensors : Biological sensing and sensors
(310.6845) Thin films : Thin film devices and applications

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: May 4, 2009
Revised Manuscript: May 29, 2009
Manuscript Accepted: May 29, 2009
Published: June 16, 2009

Virtual Issues
Vol. 4, Iss. 8 Virtual Journal for Biomedical Optics

Citation
Paul D. Coffey, Marcus J. Swann, Thomas A. Waigh, Fred Schedin, and Jian R. Lu, "Multiple path length dual polarization interferometry," Opt. Express 17, 10959-10969 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-13-10959


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