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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 13 — Jun. 22, 2009
  • pp: 11172–11178

Observation of a bent crystal-lattice by x-ray interferometry

Enrico Massa, Giovanni Mana, and Luca Ferroglio  »View Author Affiliations

Optics Express, Vol. 17, Issue 13, pp. 11172-11178 (2009)

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The capability of operating a separate crystal x-ray interferometer over centimeter displacements has made it possible to observe minute strain fields of a bent crystal at the atomic scale resolution by means of phase-contrast x-ray topography. Measurement and predictive capabilities of lattice strain are key ingredients of a highly accurate measurement of the Si lattice parameter and of a determination of the number of atoms in a realization of the mass unit based on an atom mass. Here we show that the observed strain can be accurately predicted by a finite-element analysis of the crystal deformation.

© 2009 Optical Society of America

OCIS Codes
(110.7440) Imaging systems : X-ray imaging
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(340.0340) X-ray optics : X-ray optics
(340.7450) X-ray optics : X-ray interferometry

ToC Category:
X-ray Optics

Original Manuscript: April 13, 2009
Revised Manuscript: May 15, 2009
Manuscript Accepted: May 20, 2009
Published: June 19, 2009

Giovanni Mana, Enrico Massa, and Luca Ferroglio, "Observation of a bent crystal-lattice by x-ray interferometry," Opt. Express 17, 11172-11178 (2009)

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