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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 16 — Aug. 3, 2009
  • pp: 13810–13818

Reduction of spherical-aberration impact in microscopy by wavefront coding

G. Saavedra, I. Escobar, R. Martínez-Cuenca, E. Sánchez-Ortiga, and M. Martínez-Corral  »View Author Affiliations


Optics Express, Vol. 17, Issue 16, pp. 13810-13818 (2009)
http://dx.doi.org/10.1364/OE.17.013810


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Abstract

In modern high-NA optical scanning instruments, like scanning microscopes, the refractive-index mismatch between the sample and the immersion medium introduces a significant amount of spherical aberration when imaging deep inside the specimen, spreading out the impulse response. Since such aberration depends on the focalization depth, it is not possible to achieve a static global compensation for the whole 3D sample in scanning microscopy. Therefore a depth-variant impulse response is generated. Consequently, the design of pupil elements that increase the tolerance to this aberration is of great interest. In this paper we report a hybrid technique that provides a focal spot that remains almost invariant in the depth-scanning processing of thick samples. This invariance allows the application of 3D deconvolution techniques to that provide an improved recovery of the specimen structure when imaging thick samples.

© 2009 OSA

OCIS Codes
(100.2000) Image processing : Digital image processing
(100.6890) Image processing : Three-dimensional image processing
(110.6880) Imaging systems : Three-dimensional image acquisition
(180.6900) Microscopy : Three-dimensional microscopy

ToC Category:
Microscopy

History
Original Manuscript: May 4, 2009
Revised Manuscript: June 23, 2009
Manuscript Accepted: June 24, 2009
Published: July 24, 2009

Virtual Issues
Vol. 4, Iss. 10 Virtual Journal for Biomedical Optics

Citation
G. Saavedra, I. Escobar, R. Martínez-Cuenca, E. Sánchez-Ortiga, and M. Martínez-Corral, "Reduction of spherical-aberration impact in microscopy by wavefront coding," Opt. Express 17, 13810-13818 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-16-13810


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