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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 24 — Nov. 23, 2009
  • pp: 21794–21801

Mid-infrared near-field spectroscopy

Sergiu Amarie, Thomas Ganz, and Fritz Keilmann  »View Author Affiliations

Optics Express, Vol. 17, Issue 24, pp. 21794-21801 (2009)

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We demonstrate continuous infrared spectra from 20 nm sample spots, by combining dispersive Fourier-transform infrared spectroscopy (FTIR) with scattering near-field microscopy (s-SNOM). With the “apertureless” tip of a standard AFM cantilever in one arm of a Michelson interferometer the spectra arise simultaneously in amplitude and phase. The effect of near-field phonon resonance of SiC is used to verify background-free s-SNOM operation, and to determine the absolute scattering efficiency, at 6 cm−1 spectral resolution. We further report first evidence of free-induction decay from a scatterer composed of parts coupled by near-fields. This is possible only with broadband illumination. It offers a new, unique tool to discriminate against background scattering artifacts.

© 2009 OSA

OCIS Codes
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms
(300.6340) Spectroscopy : Spectroscopy, infrared
(180.4243) Microscopy : Near-field microscopy
(160.2710) Materials : Inhomogeneous optical media

ToC Category:

Original Manuscript: October 12, 2009
Revised Manuscript: November 6, 2009
Manuscript Accepted: November 7, 2009
Published: November 12, 2009

Sergiu Amarie, Thomas Ganz, and Fritz Keilmann, "Mid-infrared near-field spectroscopy," Opt. Express 17, 21794-21801 (2009)

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  1. F. Keilmann, and R. Hillenbrand, “Near-field nanoscopy by elastic light scattering from a tip,” in Nano-Optics and Near-Field Optical Microscopy, A. Zayats and D. Richards, eds. (ArtechHouse, 2009).
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