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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 4 — Feb. 16, 2009
  • pp: 2670–2685

Measurement of coherent x-ray focused beams by phase retrieval with transverse translation diversity

Manuel Guizar-Sicairos and James R. Fienup  »View Author Affiliations

Optics Express, Vol. 17, Issue 4, pp. 2670-2685 (2009)

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We describe a method for characterizing focused x-ray beams using phase retrieval, with diversity achieved by transversely translating a phase-shifting or absorbing structure close to the beam focus. The required measurements can be taken with an experimental setup that is similar to that already used for fluorescent scan testing. The far-field intensity pattern is measured for each position of the translating structure, and the collected measurements are jointly used to estimate the beam profile by using a nonlinear optimization gradient search algorithm. The capability to reconstruct 1D and 2D beam foci is demonstrated through numerical simulations.

© 2009 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(110.7440) Imaging systems : X-ray imaging
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)
(140.3295) Lasers and laser optics : Laser beam characterization
(110.3200) Imaging systems : Inverse scattering

ToC Category:
Image Processing

Original Manuscript: November 7, 2008
Revised Manuscript: December 10, 2008
Manuscript Accepted: January 16, 2009
Published: February 10, 2009

Virtual Issues
Vol. 4, Iss. 4 Virtual Journal for Biomedical Optics

Manuel Guizar-Sicairos and James R. Fienup, "Measurement of coherent x-ray focused beams by phase retrieval with transverse translation diversity," Opt. Express 17, 2670-2685 (2009)

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