Dispersion extraction with near-field measurements in periodic waveguides
Optics Express, Vol. 17, Issue 5, pp. 3716-3721 (2009)
http://dx.doi.org/10.1364/OE.17.003716
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Abstract
We formulate and demonstrate experimentally the high-resolution spectral method based on Bloch-wave symmetry properties for extracting mode dispersion in periodic waveguides from measurements of near-field profiles. We characterize both the propagating and evanescent modes, and also determine the amplitudes of forward and backward waves in different waveguide configurations, with the estimated accuracy of several percent or less. Whereas the commonly employed spatial Fourier-transform (SFT) analysis provides the wavenumber resolution which is limited by the inverse length of the waveguide, we achieve precise dispersion extraction even for compact photonic structures.
© 2009 Optical Society of America
OCIS Codes
(230.7370) Optical devices : Waveguides
(250.5300) Optoelectronics : Photonic integrated circuits
(050.5298) Diffraction and gratings : Photonic crystals
ToC Category:
Photonic Crystals
History
Original Manuscript: November 30, 2008
Revised Manuscript: January 12, 2009
Manuscript Accepted: February 12, 2009
Published: February 25, 2009
Citation
Andrey A. Sukhorukov, Sangwoo Ha, Ilya V. Shadrivov, David A. Powell, and Yuri S. Kivshar, "Dispersion extraction with near-field measurements in periodic waveguides," Opt. Express 17, 3716-3721 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-5-3716
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