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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 8 — Apr. 13, 2009
  • pp: 6059–6067

A 350MHz Ti:sapphire laser comb based on monolithic scheme and absolute frequency measurement of 729nm laser

Wei Zhang, Hainian Han, Yanying Zhao, Qiang Du, and Zhiyi Wei  »View Author Affiliations


Optics Express, Vol. 17, Issue 8, pp. 6059-6067 (2009)
http://dx.doi.org/10.1364/OE.17.006059


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Abstract

We realized a novel frequency comb based on femtosecond Ti:sapphire laser with 350MHz repetition rate and monolithic scheme for carrier-envelope-offset frequency generation. Long-term stabilization of more than 9 hours was demonstrated by simultaneously locking repetition rate (frep) and carrier-envelope-offset frequency (fceo) to an atomic clock. The Allan deviations of fceo and frep are 2.3×10-13 and 1.5×10-15 at 100s averaging time, respectively, and the reproducibility of fceo with high accurate performance is also verified by comparison of the locking results recorded in 3 different days. By avoiding the extra noise induced by photonic crystal fiber, we obtained the accumulated phase error increase from in-loop to out-of-loop as small as 12 mrad [1Hz, 100kHz]. Furthermore, the absolute optical frequency of a stabilized 729nm Ti:sapphire laser which is referenced to a ultra-low expansion (ULE) cavity is measured by the comb and determined to be 411041985391583±10Hz.

© 2009 Optical Society of America

OCIS Codes
(120.3940) Instrumentation, measurement, and metrology : Metrology
(320.7090) Ultrafast optics : Ultrafast lasers
(320.7160) Ultrafast optics : Ultrafast technology

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 15, 2009
Revised Manuscript: February 27, 2009
Manuscript Accepted: March 23, 2009
Published: March 31, 2009

Citation
Wei Zhang, Hainian Han, Yanying Zhao, Qiang Du, and Zhiyi Wei, "A 350MHz Ti:sapphire laser comb based on monolithic scheme and absolute frequency measurement of 729nm laser," Opt. Express 17, 6059-6067 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-8-6059


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