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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 8 — Apr. 13, 2009
  • pp: 6509–6518

Controlling the plasmon resonance wavelength in metal-coated probe using refractive index modification

Atsushi Taguchi, Norihiko Hayazawa, Yuika Saito, Hidekazu Ishitobi, Alvarado Tarun, and Satoshi Kawata  »View Author Affiliations


Optics Express, Vol. 17, Issue 8, pp. 6509-6518 (2009)
http://dx.doi.org/10.1364/OE.17.006509


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Abstract

We present a novel technique to tune the plasmon resonance of metal-coated silicon tips in the whole visible region without altering the tips original sharpness. The technique involves modification of the refractive index of silicon probe by thermal oxidization. Lowering the refractive index of silicon tip coated with metal shift the plasmon resonance of the metallic layer to shorter wavelength. Numerical simulation using FDTD agrees well with the empirical results. This novel technique is very useful in tip-enhanced Raman spectroscopy studies of various materials because plasmon resonance can tuned to a specific Raman excitation wavelength.

© 2009 Optical Society of America

OCIS Codes
(310.6860) Thin films : Thin films, optical properties
(310.4165) Thin films : Multilayer design
(220.4241) Optical design and fabrication : Nanostructure fabrication
(180.4243) Microscopy : Near-field microscopy
(250.5403) Optoelectronics : Plasmonics
(240.6695) Optics at surfaces : Surface-enhanced Raman scattering

ToC Category:
Optics at Surfaces

History
Original Manuscript: January 26, 2009
Revised Manuscript: February 19, 2009
Manuscript Accepted: February 19, 2009
Published: April 3, 2009

Citation
Atsushi Taguchi, Norihiko Hayazawa, Yuika Saito, Hidekazu Ishitobi, Alvarado Tarun, and Satoshi Kawata, "Controlling the plasmon resonance wavelength in metal-coated probe using refractive index modification," Opt. Express 17, 6509-6518 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-8-6509


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