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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 9 — Apr. 27, 2009
  • pp: 7025–7035

Practical methods for retrace error correction in nonnull aspheric testing

Dong Liu, Yongying Yang, Chao Tian, Yongjie Luo, and Lin Wang  »View Author Affiliations


Optics Express, Vol. 17, Issue 9, pp. 7025-7035 (2009)
http://dx.doi.org/10.1364/OE.17.007025


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Abstract

Nonnull test is often adopted for aspheric testing. But due to its violation of null condition, the testing rays will follow different paths from the reference and aberrations from the interferometer will not cancel out, leading to widely difference between the obtained surface figure and that of the real, which is called the Retrace-error accordingly. In this paper, retrace error of nonnull aspheric testing is analyzed in detail with conclusions that retrace error has much to do with the aperture, F number and surface shape error of the aspheric under test. Correcting methods are proposed according to the manner of the retrace errors. Both computer simulation and experimental results show that the proposed methods can correct the retrace error effectively. The analysis and proposed correction methods bring much to the application of nonnull aspheric testing.

© 2009 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: March 5, 2009
Revised Manuscript: April 1, 2009
Manuscript Accepted: April 2, 2009
Published: April 13, 2009

Citation
Dong Liu, Yongying Yang, Chao Tian, Yongjie Luo, and Lin Wang, "Practical methods for retrace error correction in nonnull aspheric testing," Opt. Express 17, 7025-7035 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-9-7025


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