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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 10 — May. 10, 2010
  • pp: 10704–10719

Fringe image analysis based on the amplitude modulation method

Shaoyan Gai and Feipeng Da  »View Author Affiliations


Optics Express, Vol. 18, Issue 10, pp. 10704-10719 (2010)
http://dx.doi.org/10.1364/OE.18.010704


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Abstract

A novel phase-analysis method is proposed. To get the fringe order of a fringe image, the amplitude-modulation fringe pattern is carried out, which is combined with the phase-shift method. The primary phase value is obtained by a phase-shift algorithm, and the fringe-order information is encoded in the amplitude-modulation fringe pattern. Different from other methods, the amplitude-modulation fringe identifies the fringe order by the amplitude of the fringe pattern. In an amplitude-modulation fringe pattern, each fringe has its own amplitude; thus, the order information is integrated in one fringe pattern, and the absolute fringe phase can be calculated correctly and quickly with the amplitude-modulation fringe image. The detailed algorithm is given, and the error analysis of this method is also discussed. Experimental results are presented by a full-field shape measurement system where the data has been processed using the proposed algorithm.

© 2010 OSA

OCIS Codes
(100.2000) Image processing : Digital image processing
(100.6890) Image processing : Three-dimensional image processing
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(150.6910) Machine vision : Three-dimensional sensing

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: February 11, 2010
Revised Manuscript: March 26, 2010
Manuscript Accepted: April 22, 2010
Published: May 7, 2010

Citation
Shaoyan Gai and Feipeng Da, "Fringe image analysis based on the amplitude modulation method," Opt. Express 18, 10704-10719 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-10-10704


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