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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 12 — Jun. 7, 2010
  • pp: 12543–12551

Optical properties of red emitting self-assembled InP/(Al0.20Ga0.80)0.51In0.49P quantum dot based micropillars

Wolfgang-Michael Schulz, Tim Thomay, Marcus Eichfelder, Moritz Bommer, Michael Wiesner, Robert Roßbach, Michael Jetter, Rudolf Bratschitsch, Alfred Leitenstorfer, and Peter Michler  »View Author Affiliations

Optics Express, Vol. 18, Issue 12, pp. 12543-12551 (2010)

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Using focused ion beam etching techniques, micropillar cavities were fabricated from a high reflective AlAs/AlGaAs distributed Bragg reflector planar cavity containing self-assembled InP quantum dots in (Al0.20Ga0.80)0.51In0.49P barrier layers. The mode spectra of pillars with different diameters were investigated using micro-photoluminescence, showing excellent agreement with theory. Quality factors of the pillar cavities up to 3650 were observed. Furthermore, for a microcavity pillar with 1.26 µm diameter, single-photon emission is demonstrated by performing photon correlation measurements under pulsed excitation.

© 2010 OSA

OCIS Codes
(220.4000) Optical design and fabrication : Microstructure fabrication
(230.1480) Optical devices : Bragg reflectors
(230.5750) Optical devices : Resonators
(270.5290) Quantum optics : Photon statistics

ToC Category:
Optical Devices

Original Manuscript: February 17, 2010
Revised Manuscript: April 22, 2010
Manuscript Accepted: May 3, 2010
Published: May 27, 2010

Wolfgang-Michael Schulz, Tim Thomay, Marcus Eichfelder, Moritz Bommer, Michael Wiesner, Robert Roßbach, Michael Jetter, Rudolf Bratschitsch, Alfred Leitenstorfer, and Peter Michler, "Optical properties of red emitting self-assembled InP/(Al0.20Ga0.80)0.51In0.49P quantum dot based micropillars," Opt. Express 18, 12543-12551 (2010)

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