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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 14 — Jul. 5, 2010
  • pp: 14488–14495

Design and characterization of terahertz-absorbing nano-laminates of dielectric and metal thin films

C. Bolakis, D. Grbovic, N. V. Lavrik, and G. Karunasiri  »View Author Affiliations

Optics Express, Vol. 18, Issue 14, pp. 14488-14495 (2010)

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A terahertz-absorbing thin-film stack, containing a dielectric Bragg reflector and a thin chromium metal film, was fabricated on a silicon substrate for applications in bi-material terahertz (THz) sensors. The Bragg reflector is to be used for optical readout of sensor deformation under THz illumination. The THz absorption characteristics of the thin-film composite were measured using Fourier transform infrared spectroscopy. The absorption of the structure was calculated both analytically and by finite element modeling and the two approaches agreed well. Finite element modeling provides a convenient way to extract the amount of power dissipation in each layer and is used to quantify the THz absorption in the multi-layer stack. The calculation and the model were verified by experimentally characterizing the multi-layer stack in the 3-5 THz range. The measured and simulated absorption characteristics show a reasonably good agreement. It was found that the composite film absorbed about 20% of the incident THz power. The model was used to optimize the thickness of the chromium film for achieving high THz absorption and found that about 50% absorption can be achieved when film thickness is around 9 nm.

© 2010 OSA

OCIS Codes
(300.1030) Spectroscopy : Absorption
(310.6860) Thin films : Thin films, optical properties
(040.2235) Detectors : Far infrared or terahertz

ToC Category:
Thin Films

Original Manuscript: May 10, 2010
Revised Manuscript: June 8, 2010
Manuscript Accepted: June 9, 2010
Published: June 22, 2010

C. Bolakis, D. Grbovic, N. V. Lavrik, and G. Karunasiri, "Design and characterization of terahertz-absorbing nano-laminates of dielectric and metal thin films," Opt. Express 18, 14488-14495 (2010)

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