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Interaction of short x-ray pulses with low-Z x-ray optics materials at the LCLS free-electron laserS. P. Hau-Riege, R. A. London, A. Graf, S. L. Baker, R. Soufli, R. Sobierajski, T. Burian, J. Chalupsky, L. Juha, J. Gaudin, J. Krzywinski, S. Moeller, M. Messerschmidt, J. Bozek, and C. Bostedt »View Author Affiliations
S. P. Hau-Riege,1,*
R. A. London,1
A. Graf,1
S. L. Baker,1
R. Soufli,1
R. Sobierajski,2,3
T. Burian,4
J. Chalupsky,4,5
L. Juha,4
J. Gaudin,6
J. Krzywinski,7
S. Moeller,7
M. Messerschmidt,7
J. Bozek,7
and C. Bostedt7
1Lawrence Livermore National Laboratory, Livermore, California 94550, USA 2Institute of Physics PAS, Al. Lotników 32/46, PL-02-668 Warsaw, Poland 3FOM -Institute for Plasma Physics Rijnhuizen, NL-3430 BE Nieuwegein, The Netherlands 4Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8, Czech Republic 5Faculty of Nuclear Science and Physical Engineering, Czech Technical University in Prague, Brehova 7, 115 19 Prague 1, Czech Republic 6European XFEL GmbH, Albert-Einstein-Ring 19, D-22761 Hamburg, Germany 7SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025, USA *Corresponding author: hauriege1@llnl.gov |
Optics Express, Vol. 18, Issue 23, pp. 23933-23938 (2010)
http://dx.doi.org/10.1364/OE.18.023933
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Abstract
Materials used for hard x-ray-free-electron laser (XFEL) optics must withstand high-intensity x-ray pulses. The advent of the Linac Coherent Light Source has enabled us to expose candidate optical materials, such as bulk B4C and SiC films, to 0.83 keV XFEL pulses with pulse energies between 1 μJ and 2 mJ to determine short-pulse hard x-ray damage thresholds. The fluence required for the onset of damage for single pulses is around the melt fluence and slightly lower for multiple pulses. We observed strong mechanical cracking in the materials, which may be due to the larger penetration depths of the hard x-rays.
© 2010 OSA
OCIS Codes
(160.4670) Materials : Optical materials
(340.0340) X-ray optics : X-ray optics
ToC Category:
X-ray Optics
History
Original Manuscript: August 16, 2010
Manuscript Accepted: October 5, 2010
Published: October 29, 2010
Citation
S. P. Hau-Riege, R. A. London, A. Graf, S. L. Baker, R. Soufli, R. Sobierajski, T. Burian, J. Chalupsky, L. Juha, J. Gaudin, J. Krzywinski, S. Moeller, M. Messerschmidt, J. Bozek, and C. Bostedt, "Interaction of short x-ray pulses
with low-Z x-ray optics materials
at the LCLS free-electron laser," Opt. Express 18, 23933-23938 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-23-23933
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References
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- K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009). [CrossRef]
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- S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010). [CrossRef] [PubMed]
- S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010). [CrossRef] [PubMed]
- Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009). [CrossRef] [PubMed]
- S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008). [CrossRef]
- S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009). [CrossRef]
- S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007). [CrossRef]
- Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009). [CrossRef] [PubMed]
- K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009). [CrossRef]
- S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009). [CrossRef]
- S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007). [CrossRef]
- R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009). [CrossRef]
- K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009). [CrossRef]
- Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009). [CrossRef] [PubMed]
- K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009). [CrossRef]
- R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009). [CrossRef]
- S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009). [CrossRef]
- S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008). [CrossRef]
- S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010). [CrossRef] [PubMed]
- S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, and J. Krzywinski, “Measurement of x-ray free-electron-laser pulse energies by photoluminescence in nitrogen gas,” J. Appl. Phys. 103(5), 053306 (2008). [CrossRef]
- K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009). [CrossRef]
- K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009). [CrossRef]
- K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009). [CrossRef]
- K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009). [CrossRef]
- S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010). [CrossRef] [PubMed]
- S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008). [CrossRef]
- J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009). [CrossRef]
- S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008). [CrossRef]
- J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009). [CrossRef]
- S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009). [CrossRef]
- S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007). [CrossRef]
- S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007). [CrossRef]
- S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009). [CrossRef]
- R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009). [CrossRef]
- S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008). [CrossRef]
- S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010). [CrossRef] [PubMed]
- R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009). [CrossRef]
- K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009). [CrossRef]
- S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007). [CrossRef]
- J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009). [CrossRef]
- K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009). [CrossRef]
- K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009). [CrossRef]
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