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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 24 — Nov. 22, 2010
  • pp: 24975–24982

Observation of the Talbot effect using broadband hard x-ray beam

Jae Myung Kim, In Hwa Cho, Su Yong Lee, Hyon Chol Kang, Ray Conley, Chian Liu, Albert T. Macrander, and Do Young Noh  »View Author Affiliations

Optics Express, Vol. 18, Issue 24, pp. 24975-24982 (2010)

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We demonstrated the Talbot effect using a broadband hard x-ray beam (Δλ/λ ~1). The exit wave-field of the x-ray beam passing through a grating with a sub micro-meter scale period was successfully replicated and recorded at effective Talbot distance, ZT. The period was reduced to half at ZT/4 and 3/4ZT, and the phase reversal was observed at ZT/2. The propagating wave-field recorded on photoresists was consistent with a simulated result.

© 2010 OSA

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(050.1970) Diffraction and gratings : Diffractive optics
(050.5080) Diffraction and gratings : Phase shift
(110.6760) Imaging systems : Talbot and self-imaging effects
(340.7450) X-ray optics : X-ray interferometry

ToC Category:
X-ray Optics

Original Manuscript: September 15, 2010
Revised Manuscript: October 27, 2010
Manuscript Accepted: October 28, 2010
Published: November 15, 2010

Jae Myung Kim, In Hwa Cho, Su Yong Lee, Hyon Chol Kang, Ray Conley, Chian Liu, Albert T. Macrander, and Do Young Noh, "Observation of the Talbot effect using broadband hard x-ray beam," Opt. Express 18, 24975-24982 (2010)

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