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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 24 — Nov. 22, 2010
  • pp: 25116–25126

Three-dimensional depth-resolved and extended-resolution micro-particle characterization by holographic light scattering spectroscopy

Thomas Gutzler, Timothy R. Hillman, Sergey A. Alexandrov, and David D. Sampson  »View Author Affiliations

Optics Express, Vol. 18, Issue 24, pp. 25116-25126 (2010)

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Fourier-holographic light scattering spectroscopy is applied to record complex angular scattering spectra of two- and three-dimensional samples over a wide field of view. We introduce a computational depth sectioning technique and, for the first time, demonstrate that a single-exposure hologram can generate a quantitative, three-dimensional map of particle sizes and locations over several cubic millimeters with micrometer resolution. Such spatially resolved maps of particle sizes are generated by Mie-inversion and could not be ascertained from the directly reconstructed intensity-distribution images. We also demonstrate synthesis of multiple angular scattering intensity spectra to increase the angular range and improve size detection sensitivity.

© 2010 OSA

OCIS Codes
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(090.0090) Holography : Holography
(100.2000) Image processing : Digital image processing
(100.6890) Image processing : Three-dimensional image processing
(120.3890) Instrumentation, measurement, and metrology : Medical optics instrumentation
(170.1650) Medical optics and biotechnology : Coherence imaging
(170.3880) Medical optics and biotechnology : Medical and biological imaging

ToC Category:
Image Processing

Original Manuscript: August 5, 2010
Revised Manuscript: November 2, 2010
Manuscript Accepted: November 5, 2010
Published: November 17, 2010

Thomas Gutzler, Timothy R. Hillman, Sergey A. Alexandrov, and David D. Sampson, "Three-dimensional depth-resolved and extended-resolution micro-particle characterization by holographic light scattering spectroscopy," Opt. Express 18, 25116-25126 (2010)

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