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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 25 — Dec. 6, 2010
  • pp: 26625–26630

Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique

W. Ding, A. V. Gorbach, W. J. Wadsworth, J. C. Knight, D. V. Skryabin, M. J. Strain, M. Sorel, and R. M. De La Rue  »View Author Affiliations

Optics Express, Vol. 18, Issue 25, pp. 26625-26630 (2010)

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We report time domain measurements of the group-velocity-dispersion-induced and nonlinearity-induced chirping of femtosecond pulses in subwavelength silicon-on-insulator waveguides. We observe that at a critical input power level, these two effects compensate each other leading to soliton formation. Formation of the fundamental optical soliton is observed at a peak power of a few Watts inside the waveguide. Interferometric cross-correlation traces reveal compression of the soliton pulses, while spectral measurements show pronounced dispersive (Cherenkov) waves emitted by solitons into the wavelength range of normal group velocity dispersion.

© 2010 Optical Society of America

OCIS Codes
(130.2790) Integrated optics : Guided waves
(130.4310) Integrated optics : Nonlinear
(190.4390) Nonlinear optics : Nonlinear optics, integrated optics
(190.5530) Nonlinear optics : Pulse propagation and temporal solitons

ToC Category:
Nonlinear Optics

Original Manuscript: October 28, 2010
Revised Manuscript: December 1, 2010
Manuscript Accepted: December 1, 2010
Published: December 3, 2010

W. Ding, A. V. Gorbach, W. J. Wadswarth, J. C. Knight, D. V. Skryabin, M. J. Strain, M. Sorel, and R. M. De La Rue, "Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique," Opt. Express 18, 26625-26630 (2010)

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