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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 26 — Dec. 20, 2010
  • pp: 27836–27845

Spot size characterization of focused non-Gaussian X-ray laser beams

J. Chalupský, J. Krzywinski, L. Juha, V. Hájková, J. Cihelka, T. Burian, L. Vyšín, J. Gaudin, A. Gleeson, M. Jurek, A. R. Khorsand, D. Klinger, H. Wabnitz, R. Sobierajski, M. Störmer, K. Tiedtke, and S. Toleikis  »View Author Affiliations

Optics Express, Vol. 18, Issue 26, pp. 27836-27845 (2010)

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We present a new technique for the characterization of non-Gaussian laser beams which cannot be described by an analytical formula. As a generalization of the beam spot area we apply and refine the definition of so called effective area (Aeff) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which is inappropriate for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft X-ray free-electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination are presented in this work. An F-scan method, newly developed in this paper, appears to be a good candidate for the spatial beam diagnostics applicable to lasers of various kinds.

© 2010 OSA

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(140.2600) Lasers and laser optics : Free-electron lasers (FELs)
(140.7240) Lasers and laser optics : UV, EUV, and X-ray lasers
(340.0340) X-ray optics : X-ray optics

ToC Category:
X-ray Optics

Original Manuscript: October 14, 2010
Revised Manuscript: December 3, 2010
Manuscript Accepted: December 6, 2010
Published: December 17, 2010

J. Chalupský, J. Krzywinski, L. Juha, V. Hájková, J. Cihelka, T. Burian, L. Vyšín, J. Gaudin, A. Gleeson, M. Jurek, A. R. Khorsand, D. Klinger, H. Wabnitz, R. Sobierajski, M. Störmer, K. Tiedtke, and S. Toleikis, "Spot size characterization of focused non-Gaussian X-ray laser beams," Opt. Express 18, 27836-27845 (2010)

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