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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 3 — Feb. 1, 2010
  • pp: 2056–2075

Microwave measurements of the full amplitude scattering matrix of a complex aggregate: a database for the assessment of light scattering codes

Olivier Merchiers, Christelle Eyraud, Jean-Michel Geffrin, Rodolphe Vaillon, Brian Stout, Pierre Sabouroux, and Bernard Lacroix  »View Author Affiliations


Optics Express, Vol. 18, Issue 3, pp. 2056-2075 (2010)
http://dx.doi.org/10.1364/OE.18.002056


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Abstract

We present an extensive experimental study of microwave scattering by a fully characterized complex aggregate. We measured the full amplitude scattering matrix (amplitude and phase of the four elements) for a wide range of configurations. The presented results are of special interest to the light scattering community. Our experiments offer the possibility to validate numerical methods against experiments, since the geometrical and dielectric properties of the complex target are known to a high degree of precision, a situation difficult to attain in the optical regime. We analyze in detail the behaviour of amplitude and phase as a function of the scattering angle and target orientation. Furthermore, we compare different computational methods for a specific experimental configuration.

© 2010 Optical Society of America

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(290.5820) Scattering : Scattering measurements
(350.4010) Other areas of optics : Microwaves
(050.1755) Diffraction and gratings : Computational electromagnetic methods

ToC Category:
Scattering

History
Original Manuscript: December 10, 2009
Manuscript Accepted: January 11, 2010
Published: January 19, 2010

Citation
Olivier Merchiers, Christelle Eyraud, Jean-Michel Geffrin, Rodolphe Vaillon, Brian Stout, Pierre Sabouroux, and Bernard Lacroix, "Microwave measurements of the full amplitude scattering matrix of a complex aggregate: a database for the assessment of light scattering codes," Opt. Express 18, 2056-2075 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-3-2056


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