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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 6 — Mar. 15, 2010
  • pp: 6277–6287

Characterization of solar cells by photocurrent spectroscopy and current-voltage characteristics with high spatial resolution

M. Schwalm, C. Lange, W. W. Rühle, W. Stolz, K. Volz, and S. Chatterjee  »View Author Affiliations


Optics Express, Vol. 18, Issue 6, pp. 6277-6287 (2010)
http://dx.doi.org/10.1364/OE.18.006277


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Abstract

Spatially resolved photocurrent-spectroscopy and spatially resolved current-voltage characteristics are introduced as new methods to characterize solar cells. A combination of these two methods is shown to localize and characterize deficiencies and structural damages in processed solar cells with high spatial resolution. The local external and internal quantum efficiencies as well as the local characteristic parameters of the p-n junction like the short circuit current, the saturation current, the ideality factor, and the optically induced shunt resistance can be determined quantitatively. Both, a slab of a damaged and an undamaged (GaIn)(NAs) concentrator solar cell, are used as test structures. Upon these test structures domains with a high concentration of impurities in the crystal structure and structural imperfections in the upper contact region are identified and analyzed. Additional numerical simulations prove the reliability and show limits of the methods.

© 2010 OSA

OCIS Codes
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(350.6050) Other areas of optics : Solar energy

ToC Category:
Solar Energy

History
Original Manuscript: December 22, 2009
Revised Manuscript: March 5, 2010
Manuscript Accepted: March 5, 2010
Published: March 12, 2010

Virtual Issues
Focus Issue: Solar Concentrators (2010) Optics Express

Citation
M. Schwalm, C. Lange, W. W. Rühle, W. Stolz, K. Volz, and S. Chatterjee, "Characterization of solar cells by photocurrent spectroscopy and current-voltage characteristics with high spatial resolution," Opt. Express 18, 6277-6287 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-6-6277


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