Cooperative upconversion and optical gain in ion-beam sputter-deposited ErxY2-xSiO5 waveguides
Optics Express, Vol. 18, Issue 8, pp. 7724-7731 (2010)
http://dx.doi.org/10.1364/OE.18.007724
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Abstract
Single-phase, polycrystalline ErxY2-xSiO5 thin films were deposited by reactive ion-beam sputter deposition and rapid thermal annealing. Due to the crystalline nature, the silicate thin films provide peak Er3+ emission cross-section of 0.9 ± 0.02 × 10−20 cm2 that is higher than that in silica. Optical gain, with near 60% inversion, is achieved via optical pumping of a single-mode, ridge-type waveguide with the silicate core with an Er concentration of 1.7 × 1020 cm−3. Analysis of pump-power dependence of the optical gain and spontaneous emission intensity of Er3+ indicate that the gain is limited by cooperative upconversion process, whose coefficient is determined to be (8 ± 3) × 10−17 cm3/sec.
© 2010 OSA
OCIS Codes
(160.5690) Materials : Rare-earth-doped materials
(230.4480) Optical devices : Optical amplifiers
ToC Category:
Optical Devices
History
Original Manuscript: February 8, 2010
Revised Manuscript: March 15, 2010
Manuscript Accepted: March 26, 2010
Published: March 30, 2010
Citation
Kiseok Suh, Minkyung Lee, Jee Soo Chang, Hansuek Lee, Namkyoo Park, Gun Yong Sung, and Jung H. Shin, "Cooperative upconversion and optical gain in ion-beam sputter-deposited ErxY2-xSiO5 waveguides," Opt. Express 18, 7724-7731 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-8-7724
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